Thermal transient testing of LEDs: A technique enabling the design and manufacturing of reliable SSL products

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The reliability, useful operating life time and luminous flux are basically determined by the junction temperature of an LED device, therefore the life time and reliability of the final SSL application (such street lighting luminaire, cars' head lights, etc) as well. And this temperature is directly proportional to the total junction-to-ambient thermal resistance of the heat-flow path of the LED application. This paper provides an overview of the application possibilities of the thermal transient testing of LEDs (using the latest applicable JEDEC standards) in component level characterization as well as during product design, including options of die attach testing, in-situ TIM testing, during life time testing and luminaire level design and testing.

Original languageEnglish
Title of host publication2013 10th China International Forum on Solid State Lighting, ChinaSSL 2013
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages132-136
Number of pages5
ISBN (Print)9781479922505
DOIs
Publication statusPublished - Aug 4 2015
Event10th China International Forum on Solid State Lighting, ChinaSSL 2013 - Beijing, China
Duration: Nov 10 2013Nov 12 2013

Other

Other10th China International Forum on Solid State Lighting, ChinaSSL 2013
CountryChina
CityBeijing
Period11/10/1311/12/13

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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  • Cite this

    Poppe, A. (2015). Thermal transient testing of LEDs: A technique enabling the design and manufacturing of reliable SSL products. In 2013 10th China International Forum on Solid State Lighting, ChinaSSL 2013 (pp. 132-136). [7177332] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SSLCHINA.2013.7177332