Thermal testing, why do we need it?

B. Courtois, M. Rencz, T. Williams, A. Claasen, A. Ortega, A. Rubio, N. Sabry, T. Tarter

Research output: Contribution to conferencePaper

Abstract

Overheating problems have become more and more a reliability concern. Along with the increasing element density the power density in circuits and packages increases continuously. Can on-line thermal testing offer a solution for this? Is it worthwhile to use off-line thermal testing? This and similar questions will be discussed with the help of panelists of various backgrounds. Electrical design, testing, and thermal management experts will give their view about the possible solutions to prevent overheating problems.

Original languageEnglish
Number of pages1
Publication statusPublished - Jan 1 1997
EventProceedings of the 1997 15th VLSI Test Symposium - Monterey, CA, USA
Duration: Apr 27 1997May 1 1997

Other

OtherProceedings of the 1997 15th VLSI Test Symposium
CityMonterey, CA, USA
Period4/27/975/1/97

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ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Courtois, B., Rencz, M., Williams, T., Claasen, A., Ortega, A., Rubio, A., Sabry, N., & Tarter, T. (1997). Thermal testing, why do we need it?. Paper presented at Proceedings of the 1997 15th VLSI Test Symposium, Monterey, CA, USA, .