Thermal spike analysis of interface mixing induced by swift heavy ions

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Abstract

Thermal spike analysis of interface mixing induced by swift heavy ions was discussed. Diffusion in the ion-induced melt was assumed and an expression for the variation of the mixing rate k with the electronic stopping power Se was derived. Average diffusion coefficients in the spike, Dd≈0.053, 0.03, and 0.004 cm2/s were obtained for Zn, Ni, and Cu ions, respectively.

Original languageEnglish
Pages (from-to)4622-4624
Number of pages3
JournalApplied Physics Letters
Volume81
Issue number24
DOIs
Publication statusPublished - Dec 9 2002

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spikes
heavy ions
stopping power
ions
diffusion coefficient
electronics

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Thermal spike analysis of interface mixing induced by swift heavy ions. / Szenes, G.

In: Applied Physics Letters, Vol. 81, No. 24, 09.12.2002, p. 4622-4624.

Research output: Contribution to journalArticle

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