Thermal resistance measurement of discrete capacitors

Zoltan Sarkany, Gabor Farkas, Marta Rencz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Not only the active devices are affected by the generated power in electronics but capacitors also suffer from the elevated temperature levels. This paper attempts transferring the concepts of the thermal transient measurement method used in the semiconductor characterization to capacitor components. We show how temperature dependent electrical parameters could be used to measure the temperature of capacitors and also discuss the key requirements against the measurement setup.

Original languageEnglish
Title of host publication2015 IEEE 17th Electronics Packaging and Technology Conference, EPTC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467372688
DOIs
Publication statusPublished - Feb 17 2016
Event17th IEEE Electronics Packaging and Technology Conference, EPTC 2015 - Singapore, Singapore
Duration: Dec 2 2015Dec 4 2015

Publication series

NameProceedings of the Electronic Packaging Technology Conference, EPTC
Volume2016-February

Other

Other17th IEEE Electronics Packaging and Technology Conference, EPTC 2015
CountrySingapore
CitySingapore
Period12/2/1512/4/15

    Fingerprint

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Sarkany, Z., Farkas, G., & Rencz, M. (2016). Thermal resistance measurement of discrete capacitors. In 2015 IEEE 17th Electronics Packaging and Technology Conference, EPTC 2015 [7412332] (Proceedings of the Electronic Packaging Technology Conference, EPTC; Vol. 2016-February). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EPTC.2015.7412332