Thermal resistance measurement of discrete capacitors

Zoltan Sarkany, Gabor Farkas, M. Rencz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Not only the active devices are affected by the generated power in electronics but capacitors also suffer from the elevated temperature levels. This paper attempts transferring the concepts of the thermal transient measurement method used in the semiconductor characterization to capacitor components. We show how temperature dependent electrical parameters could be used to measure the temperature of capacitors and also discuss the key requirements against the measurement setup.

Original languageEnglish
Title of host publication2015 IEEE 17th Electronics Packaging and Technology Conference, EPTC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Volume2016-February
ISBN (Electronic)9781467372688
DOIs
Publication statusPublished - Feb 17 2016
Event17th IEEE Electronics Packaging and Technology Conference, EPTC 2015 - Singapore, Singapore
Duration: Dec 2 2015Dec 4 2015

Other

Other17th IEEE Electronics Packaging and Technology Conference, EPTC 2015
CountrySingapore
CitySingapore
Period12/2/1512/4/15

Fingerprint

thermal resistance
Heat resistance
capacitors
Capacitors
Temperature
temperature
Electronic equipment
Semiconductor materials
requirements
electronics

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Sarkany, Z., Farkas, G., & Rencz, M. (2016). Thermal resistance measurement of discrete capacitors. In 2015 IEEE 17th Electronics Packaging and Technology Conference, EPTC 2015 (Vol. 2016-February). [7412332] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EPTC.2015.7412332

Thermal resistance measurement of discrete capacitors. / Sarkany, Zoltan; Farkas, Gabor; Rencz, M.

2015 IEEE 17th Electronics Packaging and Technology Conference, EPTC 2015. Vol. 2016-February Institute of Electrical and Electronics Engineers Inc., 2016. 7412332.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sarkany, Z, Farkas, G & Rencz, M 2016, Thermal resistance measurement of discrete capacitors. in 2015 IEEE 17th Electronics Packaging and Technology Conference, EPTC 2015. vol. 2016-February, 7412332, Institute of Electrical and Electronics Engineers Inc., 17th IEEE Electronics Packaging and Technology Conference, EPTC 2015, Singapore, Singapore, 12/2/15. https://doi.org/10.1109/EPTC.2015.7412332
Sarkany Z, Farkas G, Rencz M. Thermal resistance measurement of discrete capacitors. In 2015 IEEE 17th Electronics Packaging and Technology Conference, EPTC 2015. Vol. 2016-February. Institute of Electrical and Electronics Engineers Inc. 2016. 7412332 https://doi.org/10.1109/EPTC.2015.7412332
Sarkany, Zoltan ; Farkas, Gabor ; Rencz, M. / Thermal resistance measurement of discrete capacitors. 2015 IEEE 17th Electronics Packaging and Technology Conference, EPTC 2015. Vol. 2016-February Institute of Electrical and Electronics Engineers Inc., 2016.
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