Thermal-electronic circuits

Basics, simulations, experiments

J. Mizsei, Marton C. Bein, Jyrki Lappalainen, Laszlo Juhasz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Semiconductor devices are sensitive on temperature, and they produce a lot of heat because of the high power density. Therefore thermal effects have high importance in the operation of the semiconductor based microsystems. The thermal management has key importance in the microsystem construction, however thermal effects has been treated as parasitic phenomena until now. Recent research demonstrated that beside the electrical signal the thermal signal can also be treated as logic variable. In order to get closer to both the construction aspects and modeling questions of thermal-electronic devices lateral thin film semiconductor devices were constructed by laser ablation (vanadium dioxide, VO2) and cathode sputtering technology (Pt electrodes). The high temperature sensitivity of semiconductor-metal transition (SMT) semiconductor resulted in promising switching characteristics. A model was constructed and thermal-electric simulations were performed; the results are in good correlation with the measurements validating both the model and the explanation of the behavior.

Original languageEnglish
Title of host publicationTHERMINIC 2015 - 21st International Workshop on Thermal Investigations of ICs and Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781467397056
DOIs
Publication statusPublished - Jan 21 2016
Event21st International Workshop on Thermal Investigations of ICs and Systems, THERMINIC 2015 - Paris, France
Duration: Sep 30 2015Oct 2 2015

Other

Other21st International Workshop on Thermal Investigations of ICs and Systems, THERMINIC 2015
CountryFrance
CityParis
Period9/30/1510/2/15

Fingerprint

Networks (circuits)
Microsystems
Semiconductor devices
Semiconductor materials
Thermal effects
Experiments
Thin film devices
Laser ablation
Vanadium
Transition metals
Sputtering
Cathodes
Temperature
Electrodes
Hot Temperature
Thermal management (electronics)
vanadium dioxide

ASJC Scopus subject areas

  • Fluid Flow and Transfer Processes
  • Electrical and Electronic Engineering

Cite this

Mizsei, J., Bein, M. C., Lappalainen, J., & Juhasz, L. (2016). Thermal-electronic circuits: Basics, simulations, experiments. In THERMINIC 2015 - 21st International Workshop on Thermal Investigations of ICs and Systems [7389599] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/THERMINIC.2015.7389599

Thermal-electronic circuits : Basics, simulations, experiments. / Mizsei, J.; Bein, Marton C.; Lappalainen, Jyrki; Juhasz, Laszlo.

THERMINIC 2015 - 21st International Workshop on Thermal Investigations of ICs and Systems. Institute of Electrical and Electronics Engineers Inc., 2016. 7389599.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Mizsei, J, Bein, MC, Lappalainen, J & Juhasz, L 2016, Thermal-electronic circuits: Basics, simulations, experiments. in THERMINIC 2015 - 21st International Workshop on Thermal Investigations of ICs and Systems., 7389599, Institute of Electrical and Electronics Engineers Inc., 21st International Workshop on Thermal Investigations of ICs and Systems, THERMINIC 2015, Paris, France, 9/30/15. https://doi.org/10.1109/THERMINIC.2015.7389599
Mizsei J, Bein MC, Lappalainen J, Juhasz L. Thermal-electronic circuits: Basics, simulations, experiments. In THERMINIC 2015 - 21st International Workshop on Thermal Investigations of ICs and Systems. Institute of Electrical and Electronics Engineers Inc. 2016. 7389599 https://doi.org/10.1109/THERMINIC.2015.7389599
Mizsei, J. ; Bein, Marton C. ; Lappalainen, Jyrki ; Juhasz, Laszlo. / Thermal-electronic circuits : Basics, simulations, experiments. THERMINIC 2015 - 21st International Workshop on Thermal Investigations of ICs and Systems. Institute of Electrical and Electronics Engineers Inc., 2016.
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