Thermal characterization of capacitors

Zoltan Sarkany, Gabor Farkas, M. Rencz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

The elevated temperature has negative effect not only on semiconductor components, but on discrete capacitors as well. Both the electric parameters and the lifetime can be significantly affected by the temperature. In this paper a new measurement setup is presented that enables the widely used thermal transient characterization method to be used also for the discrete capacitors. This measurement method enables the measurement of the thermal impedance of the capacitor devices allowing to construct dynamic thermal models based on measured results. Finally the capabilities of the measurement approach are demonstrated with two application examples.

Original languageEnglish
Title of host publication2016 International Conference on Electronics Packaging, ICEP 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages200-203
Number of pages4
ISBN (Electronic)9784904090176
DOIs
Publication statusPublished - Jun 7 2016
Event2016 International Conference on Electronics Packaging, ICEP 2016 - Hokkaido, Japan
Duration: Apr 20 2016Apr 22 2016

Other

Other2016 International Conference on Electronics Packaging, ICEP 2016
CountryJapan
CityHokkaido
Period4/20/164/22/16

Keywords

  • Capacitor thermal impedance
  • Thermal transient characterisation

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Mechanics of Materials

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  • Cite this

    Sarkany, Z., Farkas, G., & Rencz, M. (2016). Thermal characterization of capacitors. In 2016 International Conference on Electronics Packaging, ICEP 2016 (pp. 200-203). [7486811] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICEP.2016.7486811