Theory of picosecond transient reflectance measurement of thermal and elastic properties of thin metal films

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Picosecond transient reflectance (PTR) is a promising method for measuring the thermal and elastic properties of thin metal films, since the PTR signal of metals depends on temperature and strain coefficients of the complex dielectric constant. Methods are suggested for the determination of these coefficients as well as for the determination of the thermal and elastic parameters of thin films. Thermal transport properties may be determined after the strain edge created by the picosecond laser pulse leaves a thin layer of several optical penetration depths. The elastic properties can be measured with the help of the reflected strain pulse or at the reverse side of the sample.

Original languageEnglish
Pages (from-to)147-150
Number of pages4
JournalMaterials Science and Engineering B
Volume5
Issue number2
DOIs
Publication statusPublished - Jan 1990

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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