The use of X-ray diffraction to determine slip and twinning activity in commercial-purity (CP) titanium

T. Ungár, M. G. Glavicic, L. Balogh, K. Nyilas, A. A. Salem, G. Ribárik, S. L. Semiatin

Research output: Contribution to journalArticle

33 Citations (Scopus)

Abstract

High-resolution X-ray diffraction (XRD) line-profile analysis was used to characterize slip activity and twinning in commercial-purity titanium (CP-Ti) during hot rolling. The effect of {10.1} and {10.2} twins on XRD patterns was deduced using the DIFFAX software. The density of twin boundaries was then incorporated into the XRD pattern-fitting procedure for evaluating dislocation densities, slip activity, and subgrain size. It was found that 〈a〉 and 〈c + a〉 type slip occurred during hot rolling. The X-ray data revealed 0.07(±0.02)% twin-boundary frequency for the {10.2} twin family, but zero twinning (within the experimental accuracy) in the {10.1} family. Electron backscatter diffraction (EBSD) data confirmed the X-ray findings.

Original languageEnglish
Pages (from-to)79-85
Number of pages7
JournalMaterials Science and Engineering A
Volume493
Issue number1-2
DOIs
Publication statusPublished - Oct 15 2008

Fingerprint

Twinning
twinning
Titanium
purity
slip
titanium
Hot rolling
X ray diffraction
Diffraction patterns
diffraction
X rays
x rays
Electron diffraction
diffraction patterns
computer programs
high resolution
profiles
electrons

Keywords

  • Dislocation density
  • Slip activity
  • Titanium
  • Twinning
  • X-ray line profile analysis

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

The use of X-ray diffraction to determine slip and twinning activity in commercial-purity (CP) titanium. / Ungár, T.; Glavicic, M. G.; Balogh, L.; Nyilas, K.; Salem, A. A.; Ribárik, G.; Semiatin, S. L.

In: Materials Science and Engineering A, Vol. 493, No. 1-2, 15.10.2008, p. 79-85.

Research output: Contribution to journalArticle

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AU - Nyilas, K.

AU - Salem, A. A.

AU - Ribárik, G.

AU - Semiatin, S. L.

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