The SXES study of the amorphous Ni-P compounds

A. Szász, L. Kertész, J. Kojnok, Z. Hegedüs, L. Tolnai

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The aim of this work is the study of the electron states of Ni-P compound layers made by an electroless technique using soft X-ray emission sdpectroscopy (SXES). The information from SXES depends on the thickness and state (amorphous or crystalline) off the samples. There is a systematic change in the emission lines of nickel and phosphorus between the amorphous and crystalline states. In the amorphous state the main peaks are shifted and the fine structure has a blurred shape as compared to the crystalline state. The shift and the fine structure changes in spectra can be explained by the transformation of the chemical bonds and the symmetries within the compounds. The difference in fine structure of the Cu emission line caused by the chemical bonds due to the surface covering is also studied.

Original languageEnglish
Pages (from-to)107-110
Number of pages4
JournalVacuum
Volume33
Issue number1-2
DOIs
Publication statusPublished - Jan 1 1983

ASJC Scopus subject areas

  • Instrumentation
  • Condensed Matter Physics
  • Surfaces, Coatings and Films

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    Szász, A., Kertész, L., Kojnok, J., Hegedüs, Z., & Tolnai, L. (1983). The SXES study of the amorphous Ni-P compounds. Vacuum, 33(1-2), 107-110. https://doi.org/10.1016/0042-207X(83)90540-7