The possibilities of using semi-insulating CdTe crystals as detecting material for X-ray imaging radiography

Yu M. Ivanov, V. M. Kanevsky, V. F. Dvoryankin, V. V. Artemov, A. N. Polyakov, A. A. Kudryashov, E. M. Pashaev, Z. Horváth

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

In this work techniques for producing large uniform semi-insulating detector-grade CdTe crystals which are free of major structural defects (such as twins, non-uniform dislocation density, and precipitates) have been successfully developed. These p-type CdTe crystals have low carrier concentrations and resistivities of 108-109 Ω cm. From such materials photo diodes as X-ray detectors can be designed with low leakage current, low capacitance, high speed, and high quantum efficiency.

Original languageEnglish
Title of host publicationPhysica Status Solidi C: Conferences
Pages840-844
Number of pages5
Edition3
DOIs
Publication statusPublished - 2003
Event6th International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies, EXMATEC 2002 - Budapest, Hungary
Duration: May 26 2002May 29 2002

Other

Other6th International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies, EXMATEC 2002
CountryHungary
CityBudapest
Period5/26/025/29/02

Fingerprint

Radiography
radiography
Detectors
Imaging techniques
X rays
Crystals
detectors
low currents
Quantum efficiency
Leakage currents
crystals
Carrier concentration
Precipitates
quantum efficiency
precipitates
grade
Diodes
leakage
x rays
Capacitance

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry

Cite this

Ivanov, Y. M., Kanevsky, V. M., Dvoryankin, V. F., Artemov, V. V., Polyakov, A. N., Kudryashov, A. A., ... Horváth, Z. (2003). The possibilities of using semi-insulating CdTe crystals as detecting material for X-ray imaging radiography. In Physica Status Solidi C: Conferences (3 ed., pp. 840-844) https://doi.org/10.1002/pssc.200306258

The possibilities of using semi-insulating CdTe crystals as detecting material for X-ray imaging radiography. / Ivanov, Yu M.; Kanevsky, V. M.; Dvoryankin, V. F.; Artemov, V. V.; Polyakov, A. N.; Kudryashov, A. A.; Pashaev, E. M.; Horváth, Z.

Physica Status Solidi C: Conferences. 3. ed. 2003. p. 840-844.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ivanov, YM, Kanevsky, VM, Dvoryankin, VF, Artemov, VV, Polyakov, AN, Kudryashov, AA, Pashaev, EM & Horváth, Z 2003, The possibilities of using semi-insulating CdTe crystals as detecting material for X-ray imaging radiography. in Physica Status Solidi C: Conferences. 3 edn, pp. 840-844, 6th International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies, EXMATEC 2002, Budapest, Hungary, 5/26/02. https://doi.org/10.1002/pssc.200306258
Ivanov YM, Kanevsky VM, Dvoryankin VF, Artemov VV, Polyakov AN, Kudryashov AA et al. The possibilities of using semi-insulating CdTe crystals as detecting material for X-ray imaging radiography. In Physica Status Solidi C: Conferences. 3 ed. 2003. p. 840-844 https://doi.org/10.1002/pssc.200306258
Ivanov, Yu M. ; Kanevsky, V. M. ; Dvoryankin, V. F. ; Artemov, V. V. ; Polyakov, A. N. ; Kudryashov, A. A. ; Pashaev, E. M. ; Horváth, Z. / The possibilities of using semi-insulating CdTe crystals as detecting material for X-ray imaging radiography. Physica Status Solidi C: Conferences. 3. ed. 2003. pp. 840-844
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