The low-temperature infrared optical functions of SrTiO3 determined by reflectance spectroscopy and spectroscopic ellipsometry

K. Kamarás, K. L. Barth, F. Keilmann, R. Henn, M. Reedyk, C. Thomsen, M. Cardona, J. Kircher, P. L. Richards, J. L. Stehlé

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Abstract

By combining reflectance spectroscopy and spectroscopic ellipsometry, the complex dielectric function of SrTiO3 in the frequency range 40-5000 cm-1 at 20, 100, 200, and 300 K has been determined. Using a factorized description, analytical expressions for the optical quantities were derived, giving excellent agreement with the experimental data. These can be used for two-layer fits of films on SrTiO3, e.g., of high-T c superconductors. The fit parameters complement very well those found at higher temperatures.

Original languageEnglish
Pages (from-to)1235-1240
Number of pages6
JournalJournal of Applied Physics
Volume78
Issue number2
DOIs
Publication statusPublished - 1995

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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    Kamarás, K., Barth, K. L., Keilmann, F., Henn, R., Reedyk, M., Thomsen, C., Cardona, M., Kircher, J., Richards, P. L., & Stehlé, J. L. (1995). The low-temperature infrared optical functions of SrTiO3 determined by reflectance spectroscopy and spectroscopic ellipsometry. Journal of Applied Physics, 78(2), 1235-1240. https://doi.org/10.1063/1.360364