The effect of dislocation contrast on x-ray line broadening

A new approach to line profile analysis

T. Ungár, A. Borbély

Research output: Contribution to journalArticle

662 Citations (Scopus)

Abstract

The x-ray line profiles of an ultrafine grained copper crystal, produced by equal-channel angular pressing, were measured by a special high resolution diffractometer with negligible instrumental line broadening. The analysis of the line breadths and the Fourier coefficients have shown that taking into account the contrast caused by dislocations on line profiles gives new scaling factors in the Williamson-Hall plot and in the Warren-Averbach analysis, respectively. When strain is caused by dislocations the new procedure proposed here enables a straightforward determination of particle size and strain, the latter in terms of the dislocation density.

Original languageEnglish
Pages (from-to)3173-3175
Number of pages3
JournalApplied Physics Letters
Volume69
Issue number21
Publication statusPublished - Nov 18 1996

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profiles
x rays
pressing
diffractometers
plots
scaling
copper
high resolution
coefficients
crystals

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

The effect of dislocation contrast on x-ray line broadening : A new approach to line profile analysis. / Ungár, T.; Borbély, A.

In: Applied Physics Letters, Vol. 69, No. 21, 18.11.1996, p. 3173-3175.

Research output: Contribution to journalArticle

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