The dislocation density and twin-boundary frequency determined by X-ray peak profile analysis in cold rolled magnetron-sputter deposited nanotwinned copper

Gábor Csiszár, Levente Balogh, Amit Misra, Xinghang Zhang, Tamás Ungár

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Abstract

The dislocation density and the average twin boundary frequency is determined quantitatively in as-deposited and cold-rolled nanotwinned Cu thin films by high-resolution X-ray line profile analysis. After cold-rolling the dislocation density increases considerably, whereas the twin boundary frequency decreases only slightly. The physical parameters of the substructure provided by the quantitative X-ray analysis are in agreement with earlier transmission electron microscopy observations. The flow stress of the as-deposited and the cold-rolled films is directly correlated with the average thickness of twin lamellae and the dislocation density by taking into account the Hall-Petch and Taylor type strengthening mechanisms.

Original languageEnglish
Article number043502
JournalJournal of Applied Physics
Volume110
Issue number4
DOIs
Publication statusPublished - Aug 15 2011

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ASJC Scopus subject areas

  • Physics and Astronomy(all)

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