The analysis of exponential signals by maximum likelihood estimation

Linus Michaeli, Marek Godla, Ján Šaliga, Jozef Liptak, István Kollár

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

A new method to determine the exponential components of a signal using the maximum likelihood method will be presented in this paper. The exponential stimulus signal is assumed to be distorted by superimposed exponential components with longer time constant and smaller peak value. The exponential signal to be identified is acquired by a general purpose DAQ board. The advantage of the proposed method is lower sensitivity to the additive noise and restriction of the signal processed to the full scale range of the ADC. The sensitivity of the proposed method on the measurement and processing conditions is studied theoretically and by simulation.

Original languageEnglish
Title of host publication19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing
Pages451-456
Number of pages6
Publication statusPublished - Dec 1 2013
Event19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing - Barcelona, Spain
Duration: Jul 18 2013Jul 19 2013

Publication series

Name19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing

Other

Other19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing
CountrySpain
CityBarcelona
Period7/18/137/19/13

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Michaeli, L., Godla, M., Šaliga, J., Liptak, J., & Kollár, I. (2013). The analysis of exponential signals by maximum likelihood estimation. In 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing (pp. 451-456). (19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing).