The analogy between a coherently strained epilayer on a vicinal substrate and a low-angle grain boundary

Research output: Contribution to journalLetter

3 Citations (Scopus)

Abstract

An analogy is drawn between a coherently strained epilayer on a vicinal substrate and a low-angle grain boundary on the basis of the Volterra-type picture of dislocations. Based on this analogy, the stresses and strains caused by the interfacial steps can be treated using the standard theory of dislocations. This is illustrated with two problems concerning misoriented growth of heteroepitaxial layers.

Original languageEnglish
Pages (from-to)309-312
Number of pages4
JournalJournal of Crystal Growth
Volume123
Issue number1-2
DOIs
Publication statusPublished - Sep 1992

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Chemistry

Fingerprint Dive into the research topics of 'The analogy between a coherently strained epilayer on a vicinal substrate and a low-angle grain boundary'. Together they form a unique fingerprint.

  • Cite this