TEXTURE DEFECTS AND VISUAL INSPECTION.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Image segmentation by texture is a classical problem of digital image analysis. Recently, the author has formulated a new segmentation problem which is based on the notion of texture defect, or imperfection. Imperfections are small non-textured regions that locally break the homogeneity of the texture pattern. Detection of imperfections is a novel, specific task differing from the classical texture segmentation. Imperfection analysis provides a necessary basis for designing particular application techniques aimed at defect detection in various fields of visual inspection of surfaces, such as indication of defects in wood or textiles. In this paper, the main principles of imperfection analysis are briefly outlined and a few dedicated inspection algorithms mentioned. A new procedure is suggested for the adaptive detection of texture imperfections in the presence of a slow spatial variation of the texture pattern.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsJohn F. Gilmore
PublisherSPIE
Pages185-188
Number of pages4
Volume657
ISBN (Print)0892526920
Publication statusPublished - 1986

Fingerprint

inspection
textures
Textures
Inspection
Defects
defects
textiles
Image segmentation
Image analysis
image analysis
Wood
Textiles
homogeneity
indication

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Chetverikov, D. (1986). TEXTURE DEFECTS AND VISUAL INSPECTION. In J. F. Gilmore (Ed.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 657, pp. 185-188). SPIE.

TEXTURE DEFECTS AND VISUAL INSPECTION. / Chetverikov, D.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / John F. Gilmore. Vol. 657 SPIE, 1986. p. 185-188.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chetverikov, D 1986, TEXTURE DEFECTS AND VISUAL INSPECTION. in JF Gilmore (ed.), Proceedings of SPIE - The International Society for Optical Engineering. vol. 657, SPIE, pp. 185-188.
Chetverikov D. TEXTURE DEFECTS AND VISUAL INSPECTION. In Gilmore JF, editor, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 657. SPIE. 1986. p. 185-188
Chetverikov, D. / TEXTURE DEFECTS AND VISUAL INSPECTION. Proceedings of SPIE - The International Society for Optical Engineering. editor / John F. Gilmore. Vol. 657 SPIE, 1986. pp. 185-188
@inproceedings{7303af826ddc4808ac3ff9d5997606cf,
title = "TEXTURE DEFECTS AND VISUAL INSPECTION.",
abstract = "Image segmentation by texture is a classical problem of digital image analysis. Recently, the author has formulated a new segmentation problem which is based on the notion of texture defect, or imperfection. Imperfections are small non-textured regions that locally break the homogeneity of the texture pattern. Detection of imperfections is a novel, specific task differing from the classical texture segmentation. Imperfection analysis provides a necessary basis for designing particular application techniques aimed at defect detection in various fields of visual inspection of surfaces, such as indication of defects in wood or textiles. In this paper, the main principles of imperfection analysis are briefly outlined and a few dedicated inspection algorithms mentioned. A new procedure is suggested for the adaptive detection of texture imperfections in the presence of a slow spatial variation of the texture pattern.",
author = "D. Chetverikov",
year = "1986",
language = "English",
isbn = "0892526920",
volume = "657",
pages = "185--188",
editor = "Gilmore, {John F.}",
booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",

}

TY - GEN

T1 - TEXTURE DEFECTS AND VISUAL INSPECTION.

AU - Chetverikov, D.

PY - 1986

Y1 - 1986

N2 - Image segmentation by texture is a classical problem of digital image analysis. Recently, the author has formulated a new segmentation problem which is based on the notion of texture defect, or imperfection. Imperfections are small non-textured regions that locally break the homogeneity of the texture pattern. Detection of imperfections is a novel, specific task differing from the classical texture segmentation. Imperfection analysis provides a necessary basis for designing particular application techniques aimed at defect detection in various fields of visual inspection of surfaces, such as indication of defects in wood or textiles. In this paper, the main principles of imperfection analysis are briefly outlined and a few dedicated inspection algorithms mentioned. A new procedure is suggested for the adaptive detection of texture imperfections in the presence of a slow spatial variation of the texture pattern.

AB - Image segmentation by texture is a classical problem of digital image analysis. Recently, the author has formulated a new segmentation problem which is based on the notion of texture defect, or imperfection. Imperfections are small non-textured regions that locally break the homogeneity of the texture pattern. Detection of imperfections is a novel, specific task differing from the classical texture segmentation. Imperfection analysis provides a necessary basis for designing particular application techniques aimed at defect detection in various fields of visual inspection of surfaces, such as indication of defects in wood or textiles. In this paper, the main principles of imperfection analysis are briefly outlined and a few dedicated inspection algorithms mentioned. A new procedure is suggested for the adaptive detection of texture imperfections in the presence of a slow spatial variation of the texture pattern.

UR - http://www.scopus.com/inward/record.url?scp=0022902257&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0022902257&partnerID=8YFLogxK

M3 - Conference contribution

SN - 0892526920

VL - 657

SP - 185

EP - 188

BT - Proceedings of SPIE - The International Society for Optical Engineering

A2 - Gilmore, John F.

PB - SPIE

ER -