Synchrotron X-ray line-profile analysis experiments for the in-situ microstructural characterisation of SPD nanometals during tensile deformation

Michael B. Kerber, Erhard Schafler, Arkadiusz K. Wieczorek, Gabor Ribarik, Sigrid Bernstorff, Tamas Ungar, Michael J. Zehetbauer

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

There is a great interest in the understanding of mechanical properties of nanocrystalline materials, especially of those processed by severe plastic deformation, since those exhibit both high strength and considerable ductility. A special setup for X-ray line profile analysis was developed for monitoring the microstructural evolution of in-situ tensile tests of high pressure torsion deformed samples. A comprehensive evaluation procedure is presented which allows the determination of several physical microstructural parameters. This includes a careful estimation of the error of the evaluation procedure. As an example, nickel shows a slight decrease of the size of the coherently scattering domains while the dislocation density tends to increase. The dislocation arrangement exhibits strain-field-screening of neighboring dislocations and an equal amount of screw and edge dislocations.

Original languageEnglish
Pages (from-to)770-774
Number of pages5
JournalInternational Journal of Materials Research
Volume100
Issue number6
DOIs
Publication statusPublished - Dec 1 2009

Keywords

  • In-situ characterisation
  • Nanostructured metals
  • SPD
  • Ultra-compact tensile testing
  • XPA

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Physical and Theoretical Chemistry
  • Metals and Alloys
  • Materials Chemistry

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