The low temperature superconducting phase transitions of thin W samples are measured by a superconducting switch. Thin W are connected simultaneously to a single superconducting quantum interference device. As an example to the two thin W samples on sapphire, two switches connected parallel to the samples are applied. Results showed that the switches showed a resistance of 67 Ω-1 kΩ at 4 K depending on the thickness and geometry of the Ti films and on the substrate material.
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