Switching device for the superconducting phase transition measurements of thin W films using a single superconducting quantum interference device

G. Sáfrán, M. Loidl, O. Meier, G. Angloher, F. Pröbst, W. Seidel

Research output: Contribution to journalArticle

Abstract

The low temperature superconducting phase transitions of thin W samples are measured by a superconducting switch. Thin W are connected simultaneously to a single superconducting quantum interference device. As an example to the two thin W samples on sapphire, two switches connected parallel to the samples are applied. Results showed that the switches showed a resistance of 67 Ω-1 kΩ at 4 K depending on the thickness and geometry of the Ti films and on the substrate material.

Original languageEnglish
Pages (from-to)2815-2817
Number of pages3
JournalReview of Scientific Instruments
Volume70
Issue number6
DOIs
Publication statusPublished - Jun 1999

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ASJC Scopus subject areas

  • Instrumentation

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