Surface recombination and diffusion processes in cathodoluminescence and electron bombardment induced conductivity

Research output: Contribution to journalArticle

37 Citations (Scopus)

Abstract

An analysis of the voltage dependence of cathodoluminescence and electron bombardment induced conductivity is given, taking into consideration the surface recombination and diffusion processes. The diffusion equation of DeVore is combined with Young's and Feldman's laws relating to the penetration and energy loss of incident electrons. A good agreement was obtained between the theoretical and experimental brightness vs. voltage curves. By the analysis of this curve the diffusion length L and the surface recombination velocity S may be determined. It was found that L = 0.05-0.15 micron and S = 5 × 103-5×105 cm/sec for several phosphors.

Original languageEnglish
Pages (from-to)112-116
Number of pages5
JournalJournal of Physics and Chemistry of Solids
Volume17
Issue number1-2
DOIs
Publication statusPublished - Dec 1960

    Fingerprint

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

Cite this