Surface-oriented and bulk GaAs and InP detectors for X-ray diagnostics of laser plasmas

L. Ryc, F. Riesz, M. Pfeifer, Yu V. Korobkin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Bulk and surface-oriented GaAs and InP photoconductive detectors were fabricated for laser-plasma diagnostic purposes. Current-voltage curves, pulse-height spectra measurements using light pulses and α-particles as well as pulses from different lasers are used to compare the defectors. Preliminary results using X-ray pulses from laser plasmas are presented. InP detectors were of higher performance.

Original languageEnglish
Title of host publicationASDAM 1998 Conference Proceedings
Subtitle of host publication2nd International Conference on Advanced Semiconductor Devices And Microsystems
EditorsFrantisek Uherek, Vladimir Drobny, Juraj Breza, Daniel Donoval
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages187-190
Number of pages4
Volume1998-October
ISBN (Electronic)0780349091, 9780780349094
DOIs
Publication statusPublished - Jan 1 1998
Event2nd International Conference on Advanced Semiconductor Devices And Microsystems, ASDAM 1998 - Smolenice, Slovakia
Duration: Oct 5 1998Oct 7 1998

Other

Other2nd International Conference on Advanced Semiconductor Devices And Microsystems, ASDAM 1998
CountrySlovakia
CitySmolenice
Period10/5/9810/7/98

Fingerprint

laser plasmas
Laser pulses
Detectors
Plasmas
X rays
Lasers
detectors
pulses
Light measurement
Plasma diagnostics
x rays
plasma diagnostics
pulse amplitude
Electric potential
electric potential
curves
lasers
gallium arsenide

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Instrumentation

Cite this

Ryc, L., Riesz, F., Pfeifer, M., & Korobkin, Y. V. (1998). Surface-oriented and bulk GaAs and InP detectors for X-ray diagnostics of laser plasmas. In F. Uherek, V. Drobny, J. Breza, & D. Donoval (Eds.), ASDAM 1998 Conference Proceedings: 2nd International Conference on Advanced Semiconductor Devices And Microsystems (Vol. 1998-October, pp. 187-190). [730195] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ASDAM.1998.730195

Surface-oriented and bulk GaAs and InP detectors for X-ray diagnostics of laser plasmas. / Ryc, L.; Riesz, F.; Pfeifer, M.; Korobkin, Yu V.

ASDAM 1998 Conference Proceedings: 2nd International Conference on Advanced Semiconductor Devices And Microsystems. ed. / Frantisek Uherek; Vladimir Drobny; Juraj Breza; Daniel Donoval. Vol. 1998-October Institute of Electrical and Electronics Engineers Inc., 1998. p. 187-190 730195.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ryc, L, Riesz, F, Pfeifer, M & Korobkin, YV 1998, Surface-oriented and bulk GaAs and InP detectors for X-ray diagnostics of laser plasmas. in F Uherek, V Drobny, J Breza & D Donoval (eds), ASDAM 1998 Conference Proceedings: 2nd International Conference on Advanced Semiconductor Devices And Microsystems. vol. 1998-October, 730195, Institute of Electrical and Electronics Engineers Inc., pp. 187-190, 2nd International Conference on Advanced Semiconductor Devices And Microsystems, ASDAM 1998, Smolenice, Slovakia, 10/5/98. https://doi.org/10.1109/ASDAM.1998.730195
Ryc L, Riesz F, Pfeifer M, Korobkin YV. Surface-oriented and bulk GaAs and InP detectors for X-ray diagnostics of laser plasmas. In Uherek F, Drobny V, Breza J, Donoval D, editors, ASDAM 1998 Conference Proceedings: 2nd International Conference on Advanced Semiconductor Devices And Microsystems. Vol. 1998-October. Institute of Electrical and Electronics Engineers Inc. 1998. p. 187-190. 730195 https://doi.org/10.1109/ASDAM.1998.730195
Ryc, L. ; Riesz, F. ; Pfeifer, M. ; Korobkin, Yu V. / Surface-oriented and bulk GaAs and InP detectors for X-ray diagnostics of laser plasmas. ASDAM 1998 Conference Proceedings: 2nd International Conference on Advanced Semiconductor Devices And Microsystems. editor / Frantisek Uherek ; Vladimir Drobny ; Juraj Breza ; Daniel Donoval. Vol. 1998-October Institute of Electrical and Electronics Engineers Inc., 1998. pp. 187-190
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