Surface modification of polyethylene by low keV ion beams

A. Tóth, T. Bell, I. Bertóti, M. Mohai, B. Zelei

Research output: Contribution to journalArticle

61 Citations (Scopus)

Abstract

Ultra-high molecular-weight polyethylene (UHMWPE) and linear polyethylene (LPE) were treated by low keV H2+, He+ and N2+ ion beams up to 2×1017 ions cm-2, and the chemical changes induced in the modified surface layer were studied by FT-IR and XPS. The concentration of vinyl groups decreased, while that of the trans-vinylene, trans-trans diene, methyl and carbonyl groups increased. The degree of polymer crystallinity was reduced. Changes in the valence band, in the C KVV Auger peak and in the plasmon loss splitting of the Cls peak indicated the occurrence of graphitisation. On treatment by N2+ ions - in addition to the above changes - nitrogen incorporation took place. The N-content of the surface layer reached a saturation value of ∼11 at% at ∼1017 ions cm-2. The Nls peak was decomposed to three components at 398.3, 400 and ∼402.8 eV, which were assigned to nitrogen in C-N, C=N (imine), and C=N with delocalised nonbonding electron pair on N, respectively.

Original languageEnglish
Pages (from-to)1131-1135
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume148
Issue number1-4
Publication statusPublished - 1999

Fingerprint

Polyethylene
Ion beams
Surface treatment
Polyethylenes
polyethylenes
ion beams
Ions
surface layers
Nitrogen
nitrogen
ions
Graphitization
Ultrahigh molecular weight polyethylenes
Imines
graphitization
dienes
Valence bands
imines
molecular weight
crystallinity

Keywords

  • CN
  • Ion beam
  • IR
  • Polyethylene
  • Surface structure
  • XPS

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces

Cite this

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TY - JOUR

T1 - Surface modification of polyethylene by low keV ion beams

AU - Tóth, A.

AU - Bell, T.

AU - Bertóti, I.

AU - Mohai, M.

AU - Zelei, B.

PY - 1999

Y1 - 1999

N2 - Ultra-high molecular-weight polyethylene (UHMWPE) and linear polyethylene (LPE) were treated by low keV H2+, He+ and N2+ ion beams up to 2×1017 ions cm-2, and the chemical changes induced in the modified surface layer were studied by FT-IR and XPS. The concentration of vinyl groups decreased, while that of the trans-vinylene, trans-trans diene, methyl and carbonyl groups increased. The degree of polymer crystallinity was reduced. Changes in the valence band, in the C KVV Auger peak and in the plasmon loss splitting of the Cls peak indicated the occurrence of graphitisation. On treatment by N2+ ions - in addition to the above changes - nitrogen incorporation took place. The N-content of the surface layer reached a saturation value of ∼11 at% at ∼1017 ions cm-2. The Nls peak was decomposed to three components at 398.3, 400 and ∼402.8 eV, which were assigned to nitrogen in C-N, C=N (imine), and C=N with delocalised nonbonding electron pair on N, respectively.

AB - Ultra-high molecular-weight polyethylene (UHMWPE) and linear polyethylene (LPE) were treated by low keV H2+, He+ and N2+ ion beams up to 2×1017 ions cm-2, and the chemical changes induced in the modified surface layer were studied by FT-IR and XPS. The concentration of vinyl groups decreased, while that of the trans-vinylene, trans-trans diene, methyl and carbonyl groups increased. The degree of polymer crystallinity was reduced. Changes in the valence band, in the C KVV Auger peak and in the plasmon loss splitting of the Cls peak indicated the occurrence of graphitisation. On treatment by N2+ ions - in addition to the above changes - nitrogen incorporation took place. The N-content of the surface layer reached a saturation value of ∼11 at% at ∼1017 ions cm-2. The Nls peak was decomposed to three components at 398.3, 400 and ∼402.8 eV, which were assigned to nitrogen in C-N, C=N (imine), and C=N with delocalised nonbonding electron pair on N, respectively.

KW - CN

KW - Ion beam

KW - IR

KW - Polyethylene

KW - Surface structure

KW - XPS

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VL - 148

SP - 1131

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