Surface excitation correction of the inelastic mean free path in selected conducting polymers

G. Gergely, M. Menyhárd, G. T. Orosz, B. Lesiak, A. Kosinski, A. Jablonski, R. Nowakowski, J. Tóth, D. Varga

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

In earlier works, the inelastic mean free path (IMFP) of electrons was determined by elastic peak electron spectroscopy (EPES) using Ni and Ag reference standard samples, but fully neglecting surface excitation. Surface excitation that is characterized by the surface excitation parameter (SEP), and may affect considerably the elastic peak for the sample and the reference material. The SEP parameters of selected conducting polymers (polythiophenes, polyaniline and polyethylene) were determined by EPES using Si and Ge reference samples. Experiments were made with a hemispherical analyzer of energy resolution 100-200 meV in the E = 0.2-2.0 keV energy range. The composition of the sample surfaces was determined by in situ XPS, their surface roughness by AFM. The experimental SEP parameter data of eight polymer samples were determined by our new procedure, using the formulae of Chen and Werner et al. in the E = 0.2-2.0 keV energy range. The trial and error procedure is based on the best approach between the experimental and calculated IMFPs, corrected on surface excitation. The improvement in the SEP correction appears in the difference between the corrected and Monte Carlo calculated IMFPs, assuming Gries and Tanuma et al. IMFPs for polymers and standard, respectively. The term describing the improvement by SEP resulted in 50-72% (good correction for five polymers) 24% (poor correction for one polymer), 1-6% (no correction for two polymers). The 100% correction was not achieved, indicating that the difference between experimental and calculated IMFP cannot be entirely explained by surface excitation. Using the SEP data of Si and Ge reference samples based on Chen's and Werner's material parameter values resulted in similar SEP corrections for the polymer samples.

Original languageEnglish
Pages (from-to)4982-4989
Number of pages8
JournalApplied Surface Science
Volume252
Issue number14
DOIs
Publication statusPublished - May 15 2006

Fingerprint

Conducting polymers
conducting polymers
mean free path
excitation
Polymers
polymers
Electron spectroscopy
electron spectroscopy
Polyethylene
Polyaniline
energy
Polyethylenes
polyethylenes
analyzers
surface roughness
X ray photoelectron spectroscopy
Surface roughness
atomic force microscopy

Keywords

  • Elastic peak
  • IMFP
  • Polymers
  • Surface excitation

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Condensed Matter Physics

Cite this

Surface excitation correction of the inelastic mean free path in selected conducting polymers. / Gergely, G.; Menyhárd, M.; Orosz, G. T.; Lesiak, B.; Kosinski, A.; Jablonski, A.; Nowakowski, R.; Tóth, J.; Varga, D.

In: Applied Surface Science, Vol. 252, No. 14, 15.05.2006, p. 4982-4989.

Research output: Contribution to journalArticle

Gergely, G, Menyhárd, M, Orosz, GT, Lesiak, B, Kosinski, A, Jablonski, A, Nowakowski, R, Tóth, J & Varga, D 2006, 'Surface excitation correction of the inelastic mean free path in selected conducting polymers', Applied Surface Science, vol. 252, no. 14, pp. 4982-4989. https://doi.org/10.1016/j.apsusc.2005.07.017
Gergely, G. ; Menyhárd, M. ; Orosz, G. T. ; Lesiak, B. ; Kosinski, A. ; Jablonski, A. ; Nowakowski, R. ; Tóth, J. ; Varga, D. / Surface excitation correction of the inelastic mean free path in selected conducting polymers. In: Applied Surface Science. 2006 ; Vol. 252, No. 14. pp. 4982-4989.
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AU - Menyhárd, M.

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AU - Lesiak, B.

AU - Kosinski, A.

AU - Jablonski, A.

AU - Nowakowski, R.

AU - Tóth, J.

AU - Varga, D.

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AB - In earlier works, the inelastic mean free path (IMFP) of electrons was determined by elastic peak electron spectroscopy (EPES) using Ni and Ag reference standard samples, but fully neglecting surface excitation. Surface excitation that is characterized by the surface excitation parameter (SEP), and may affect considerably the elastic peak for the sample and the reference material. The SEP parameters of selected conducting polymers (polythiophenes, polyaniline and polyethylene) were determined by EPES using Si and Ge reference samples. Experiments were made with a hemispherical analyzer of energy resolution 100-200 meV in the E = 0.2-2.0 keV energy range. The composition of the sample surfaces was determined by in situ XPS, their surface roughness by AFM. The experimental SEP parameter data of eight polymer samples were determined by our new procedure, using the formulae of Chen and Werner et al. in the E = 0.2-2.0 keV energy range. The trial and error procedure is based on the best approach between the experimental and calculated IMFPs, corrected on surface excitation. The improvement in the SEP correction appears in the difference between the corrected and Monte Carlo calculated IMFPs, assuming Gries and Tanuma et al. IMFPs for polymers and standard, respectively. The term describing the improvement by SEP resulted in 50-72% (good correction for five polymers) 24% (poor correction for one polymer), 1-6% (no correction for two polymers). The 100% correction was not achieved, indicating that the difference between experimental and calculated IMFP cannot be entirely explained by surface excitation. Using the SEP data of Si and Ge reference samples based on Chen's and Werner's material parameter values resulted in similar SEP corrections for the polymer samples.

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