Surface energy maps of nanostructures: Atomic force microscopy and numerical simulation study

Ádám Mechler, Janos Kokavecz, Peter Heszler, Ratnesh Lal

Research output: Contribution to journalArticle

31 Citations (Scopus)

Abstract

Atomic force microscopy (AFM) was used to examine topography and surface distribution of etched graphite. AFM images showed atomic monolayer deep circular holes, etch pits, which appeared surrounded by rims. Numerical simulation of AFM images showed that the rims are formed due to an increased surface energy zone at the edges.

Original languageEnglish
Pages (from-to)3740-3742
Number of pages3
JournalApplied Physics Letters
Volume82
Issue number21
DOIs
Publication statusPublished - May 26 2003

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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