Surface characterization of ultrahigh molecular weight polyethylene after nitrogen ion implantation

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24 Citations (Scopus)

Abstract

Ultrahigh molecular weight polyethylene (UHMWPE) samples were implanted with 46 and 80 keV nitrogen ions up to a fluence of 1017 ions cm-2. The modified surface layers were studied by XPS, Fourier transform infrared spectroscopy (FTIR), Rutherford backscattering spectrometry, elastic recoil detection analysis and dynamic ultra-microhardness measurements. By XPS at relatively low fluences (approximately 1015 ions cm-2) the dominant N 1s peak component was detected at approximately 400 eV, which was attributed to C double bond N-type bonds. With increasing fluence the share of component at approximately 398.5 eV, assigned to C-N-type bonds, increased significantly. Changes in the FTIR spectra reflected dehydrogenation (creation of trans-vinylene groups) and oxidation (creation of carbonyl groups). Rutherford backscattering spectrometry allowed the depth profiles of the elements to be obtained. In each case, the thickness of the oxygen-containing layer proved to be greater than that of the nitrogen-containing layer. Elastic recoil detection analysis revealed the formation of a layer with a characteristically graded hydrogen depletion. The thickness of this layer was greater than the projected range of the nitrogen ions. Significant improvement in the surface hardness was observed for the ion-implanted UHMWPE in the whole range of indentation depth studied.

Original languageEnglish
Pages (from-to)434-438
Number of pages5
JournalSurface and Interface Analysis
Volume30
Issue number1
DOIs
Publication statusPublished - Aug 2000

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Ultrahigh molecular weight polyethylenes
nitrogen ions
Ion implantation
ion implantation
polyethylenes
molecular weight
Nitrogen
Ions
fluence
Rutherford backscattering spectroscopy
backscattering
infrared spectroscopy
Spectrometry
Fourier transform infrared spectroscopy
X ray photoelectron spectroscopy
ions
dehydrogenation
indentation
microhardness
spectroscopy

ASJC Scopus subject areas

  • Colloid and Surface Chemistry
  • Physical and Theoretical Chemistry

Cite this

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title = "Surface characterization of ultrahigh molecular weight polyethylene after nitrogen ion implantation",
abstract = "Ultrahigh molecular weight polyethylene (UHMWPE) samples were implanted with 46 and 80 keV nitrogen ions up to a fluence of 1017 ions cm-2. The modified surface layers were studied by XPS, Fourier transform infrared spectroscopy (FTIR), Rutherford backscattering spectrometry, elastic recoil detection analysis and dynamic ultra-microhardness measurements. By XPS at relatively low fluences (approximately 1015 ions cm-2) the dominant N 1s peak component was detected at approximately 400 eV, which was attributed to C double bond N-type bonds. With increasing fluence the share of component at approximately 398.5 eV, assigned to C-N-type bonds, increased significantly. Changes in the FTIR spectra reflected dehydrogenation (creation of trans-vinylene groups) and oxidation (creation of carbonyl groups). Rutherford backscattering spectrometry allowed the depth profiles of the elements to be obtained. In each case, the thickness of the oxygen-containing layer proved to be greater than that of the nitrogen-containing layer. Elastic recoil detection analysis revealed the formation of a layer with a characteristically graded hydrogen depletion. The thickness of this layer was greater than the projected range of the nitrogen ions. Significant improvement in the surface hardness was observed for the ion-implanted UHMWPE in the whole range of indentation depth studied.",
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T1 - Surface characterization of ultrahigh molecular weight polyethylene after nitrogen ion implantation

AU - Tóth, A.

AU - Bertóti, I.

AU - Szilágyi, E.

AU - Dong, H.

AU - Bell, T.

AU - Juhász, A.

AU - Nagy, P.

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AB - Ultrahigh molecular weight polyethylene (UHMWPE) samples were implanted with 46 and 80 keV nitrogen ions up to a fluence of 1017 ions cm-2. The modified surface layers were studied by XPS, Fourier transform infrared spectroscopy (FTIR), Rutherford backscattering spectrometry, elastic recoil detection analysis and dynamic ultra-microhardness measurements. By XPS at relatively low fluences (approximately 1015 ions cm-2) the dominant N 1s peak component was detected at approximately 400 eV, which was attributed to C double bond N-type bonds. With increasing fluence the share of component at approximately 398.5 eV, assigned to C-N-type bonds, increased significantly. Changes in the FTIR spectra reflected dehydrogenation (creation of trans-vinylene groups) and oxidation (creation of carbonyl groups). Rutherford backscattering spectrometry allowed the depth profiles of the elements to be obtained. In each case, the thickness of the oxygen-containing layer proved to be greater than that of the nitrogen-containing layer. Elastic recoil detection analysis revealed the formation of a layer with a characteristically graded hydrogen depletion. The thickness of this layer was greater than the projected range of the nitrogen ions. Significant improvement in the surface hardness was observed for the ion-implanted UHMWPE in the whole range of indentation depth studied.

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