Results of 51V NMR Knight shift and linewidth measurements are described for thin films of V100−xZrx b.c.c. crystalline (x = 6.4 and 8.4) and amorphous (x = 17.2, 28, and 46.4) alloys prepared by rf sputtering onto copper substrates. The field dependence of the linewidth and, for x = 28 and 46.4, heat‐treatment effects were also considered. Based on these experimental data, quadrupole effect, electronic structure, and chemical short‐range order of amorphous V‐Zr alloys are discussed.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics