Summary of ISO/TC201 technical report: ISO/TR 18392: 2005 - Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for determining backgrounds

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7 Citations (Scopus)

Abstract

ISO Technical Report 18392 provides the guidance for determining backgrounds in X-ray photoelectron spectra. The methods of background determination described in this report are applicable for the quantitative evaluation of the spectra of photoelectrons and Auger electrons excited by X-rays from solid surfaces and surface nanostructures.

Original languageEnglish
Pages (from-to)1173-1175
Number of pages3
JournalSurface and Interface Analysis
Volume38
Issue number7
DOIs
Publication statusPublished - Jul 1 2006

Keywords

  • Background determination
  • ISO
  • Inelastic and elastic electron scattering
  • International Organization for Standardization
  • Quantitative surface analysis
  • X-ray photoelectron spectroscopy
  • XPS

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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