Subgrain size-distributions, dislocation structures, stacking- And twin faults and vacancy concentrations in SPD materials determined by X-ray line profile analysis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)

Abstract

The fundamentals of X-ray line profile analysis are summarised in terms of subgrain size and size-distribution, dislocation density and dislocation types, especially edge and screw dislocations, intrinsic and extrinsic stacking faults and twin boundaries and vacancies produced during plastic deformation. It is shown that deformation induced vacancy concentrations in the grain boundaries of compressed copper polycrystals are close to the equilibrium values at the melting temperature. The discrepancy between X-ray and TEM size values is discussed in terms subgrain- and grain size. It is shown that this apparent discrepancy might be used to determine the status of fragmentation by severe plastic deformation.

Original languageEnglish
Title of host publicationMaterials Science Forum
Pages133-140
Number of pages8
Volume503-504
Publication statusPublished - 2006
Event3rd International Conference on Nanomaterials by Severe Plastics Deformation, NanoSPD3 - Fukuoka, Japan
Duration: Sep 22 2005Sep 26 2005

Publication series

NameMaterials Science Forum
Volume503-504
ISSN (Print)02555476

Other

Other3rd International Conference on Nanomaterials by Severe Plastics Deformation, NanoSPD3
CountryJapan
CityFukuoka
Period9/22/059/26/05

Fingerprint

Dislocations (crystals)
Vacancies
Plastic deformation
X rays
Edge dislocations
Screw dislocations
Polycrystals
Stacking faults
Melting point
Copper
Grain boundaries
Transmission electron microscopy

Keywords

  • Dislocation density
  • Dislocation type
  • Grain boundary structure
  • Planar faults
  • Sugrain-size
  • Vacancy production

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Subgrain size-distributions, dislocation structures, stacking- And twin faults and vacancy concentrations in SPD materials determined by X-ray line profile analysis. / Ungár, T.

Materials Science Forum. Vol. 503-504 2006. p. 133-140 (Materials Science Forum; Vol. 503-504).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ungár, T 2006, Subgrain size-distributions, dislocation structures, stacking- And twin faults and vacancy concentrations in SPD materials determined by X-ray line profile analysis. in Materials Science Forum. vol. 503-504, Materials Science Forum, vol. 503-504, pp. 133-140, 3rd International Conference on Nanomaterials by Severe Plastics Deformation, NanoSPD3, Fukuoka, Japan, 9/22/05.
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