Sub-pixel detection of a grid's node positions for optical diagnostics

I. E. Lukács, Ferenc Riesz

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

A methodology of the detection of a grid's node positions with sub-pixel accuracy is described. The algorithm uses a correlation method for locating the nodes, determines the neighbourhood relations, then calculates the node positions with sub-pixel accuracy either by locating the local maxima of the correlation function either by centroiding or fitting. The accuracy of the algorithm is studied as a function of grid geometry, grid distortion, grid defocus and image noise using synthetic images, and optimum parameters are determined.

Original languageEnglish
Pages (from-to)8082-8086
Number of pages5
JournalThin Solid Films
Volume516
Issue number22
DOIs
Publication statusPublished - Sep 30 2008

Keywords

  • Machine vision
  • Optical diagnostics
  • Sub-pixel algorithm

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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