Structure evolution of NdF3 optical thin films

M. Adamik, G. Sáfrán, P. Barna, I. Tomov, U. Kaiser, S. Laux, J. Jinschek, W. Richter

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The structure evolution characteristics of NdF3 thin films has been analyzed concerning texture and grain morphology. The structure could be classified according to the structure zone models, and the growth mode could be related to zone T and zone II. Contamination of the films by residual gases was found to inhibit the migration of grain boundaries and therefore, zone II does not appear even at high substrate temperatures in contaminated films. Stratification by MgF2 interlayers may also result in a decrease of grain size and a smaller surface roughness. The correlation between deposition conditions, stratification, growth mode and optical properties is discussed.

Original languageEnglish
Pages (from-to)637-649
Number of pages13
JournalPhysica Status Solidi (A) Applied Research
Volume175
Issue number2
DOIs
Publication statusPublished - Oct 1999

Fingerprint

Optical films
stratification
Thin films
residual gas
thin films
interlayers
surface roughness
Grain boundaries
contamination
Contamination
textures
grain boundaries
Optical properties
Textures
grain size
Gases
Surface roughness
optical properties
Substrates
Temperature

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Structure evolution of NdF3 optical thin films. / Adamik, M.; Sáfrán, G.; Barna, P.; Tomov, I.; Kaiser, U.; Laux, S.; Jinschek, J.; Richter, W.

In: Physica Status Solidi (A) Applied Research, Vol. 175, No. 2, 10.1999, p. 637-649.

Research output: Contribution to journalArticle

Adamik, M. ; Sáfrán, G. ; Barna, P. ; Tomov, I. ; Kaiser, U. ; Laux, S. ; Jinschek, J. ; Richter, W. / Structure evolution of NdF3 optical thin films. In: Physica Status Solidi (A) Applied Research. 1999 ; Vol. 175, No. 2. pp. 637-649.
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