Structural defects

General approach and application to textile inspection

Research output: Chapter in Book/Report/Conference proceedingChapter

19 Citations (Scopus)

Abstract

This paper addresses detection of imperfections in repetitive regular structures (textures). Humans can easily find such defects without prior knowledge of the 'good' pattern. In this study, it is assumed that structural defects are detected as irregularities, that is, locations of lower regularity. We define pattern regularity features and find defects by robust detection of outliers in the feature space. Two tests are presented to assess the approach. In the first test, diverse texture patterns are processed individually and outliers are searched in each pattern. In the second test, classified defects in a group of textiles are considered. Defect-free patterns are used to learn distance thresholds that separate defects.

Original languageEnglish
Title of host publicationProceedings - International Conference on Pattern Recognition
Pages521-523
Number of pages3
Volume15
Edition1
Publication statusPublished - 2000

Fingerprint

Textiles
Inspection
Defects
Textures

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Computer Vision and Pattern Recognition
  • Hardware and Architecture

Cite this

Chetverikov, D. (2000). Structural defects: General approach and application to textile inspection. In Proceedings - International Conference on Pattern Recognition (1 ed., Vol. 15, pp. 521-523)

Structural defects : General approach and application to textile inspection. / Chetverikov, D.

Proceedings - International Conference on Pattern Recognition. Vol. 15 1. ed. 2000. p. 521-523.

Research output: Chapter in Book/Report/Conference proceedingChapter

Chetverikov, D 2000, Structural defects: General approach and application to textile inspection. in Proceedings - International Conference on Pattern Recognition. 1 edn, vol. 15, pp. 521-523.
Chetverikov D. Structural defects: General approach and application to textile inspection. In Proceedings - International Conference on Pattern Recognition. 1 ed. Vol. 15. 2000. p. 521-523
Chetverikov, D. / Structural defects : General approach and application to textile inspection. Proceedings - International Conference on Pattern Recognition. Vol. 15 1. ed. 2000. pp. 521-523
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