Structural and temperature-related disordering studies of Cu 6PS 5I amorphous thin films

I. P. Studenyak, M. Kranjčec, V. Yu Izai, A. A. Chomolyak, M. Vorohta, V. Matolin, C. Cserháti, S. Kökényesi

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Cu 6PS 5I thin films were deposited onto silicate glass substrates by non-reactive radio frequency magnetron sputtering. Spectrometric and isoabsorption studies of Cu 6PS 5I thin films in the temperature interval 77-500 K were performed. Structural studies were carried out using X-ray diffraction and scanning electron microscopy techniques. Temperature evolution of optical transmission spectra as well as temperature dependences of optical pseudogap and Urbach energy is investigated. The influence of temperature-related and structural disordering on the Urbach tail is studied.

Original languageEnglish
Pages (from-to)1729-1733
Number of pages5
JournalThin Solid Films
Volume520
Issue number6
DOIs
Publication statusPublished - Jan 1 2012

Fingerprint

Amorphous films
Thin films
thin films
Silicates
Temperature
temperature
silicates
radio frequencies
magnetron sputtering
Light transmission
Magnetron sputtering
intervals
temperature dependence
scanning electron microscopy
glass
diffraction
X ray diffraction
Glass
Scanning electron microscopy
x rays

Keywords

  • Absorption edge
  • Amorphous materials
  • Optical spectroscopy
  • Sputtering
  • Superionic conductors

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Metals and Alloys
  • Surfaces, Coatings and Films
  • Surfaces and Interfaces

Cite this

Studenyak, I. P., Kranjčec, M., Izai, V. Y., Chomolyak, A. A., Vorohta, M., Matolin, V., ... Kökényesi, S. (2012). Structural and temperature-related disordering studies of Cu 6PS 5I amorphous thin films. Thin Solid Films, 520(6), 1729-1733. https://doi.org/10.1016/j.tsf.2011.08.043

Structural and temperature-related disordering studies of Cu 6PS 5I amorphous thin films. / Studenyak, I. P.; Kranjčec, M.; Izai, V. Yu; Chomolyak, A. A.; Vorohta, M.; Matolin, V.; Cserháti, C.; Kökényesi, S.

In: Thin Solid Films, Vol. 520, No. 6, 01.01.2012, p. 1729-1733.

Research output: Contribution to journalArticle

Studenyak, IP, Kranjčec, M, Izai, VY, Chomolyak, AA, Vorohta, M, Matolin, V, Cserháti, C & Kökényesi, S 2012, 'Structural and temperature-related disordering studies of Cu 6PS 5I amorphous thin films', Thin Solid Films, vol. 520, no. 6, pp. 1729-1733. https://doi.org/10.1016/j.tsf.2011.08.043
Studenyak IP, Kranjčec M, Izai VY, Chomolyak AA, Vorohta M, Matolin V et al. Structural and temperature-related disordering studies of Cu 6PS 5I amorphous thin films. Thin Solid Films. 2012 Jan 1;520(6):1729-1733. https://doi.org/10.1016/j.tsf.2011.08.043
Studenyak, I. P. ; Kranjčec, M. ; Izai, V. Yu ; Chomolyak, A. A. ; Vorohta, M. ; Matolin, V. ; Cserháti, C. ; Kökényesi, S. / Structural and temperature-related disordering studies of Cu 6PS 5I amorphous thin films. In: Thin Solid Films. 2012 ; Vol. 520, No. 6. pp. 1729-1733.
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