Structural and temperature-related disordering studies of Cu 6PS 5I amorphous thin films

I. P. Studenyak, M. Kranjčec, V. Yu Izai, A. A. Chomolyak, M. Vorohta, V. Matolin, C. Cserhati, S. Kökényesi

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Cu 6PS 5I thin films were deposited onto silicate glass substrates by non-reactive radio frequency magnetron sputtering. Spectrometric and isoabsorption studies of Cu 6PS 5I thin films in the temperature interval 77-500 K were performed. Structural studies were carried out using X-ray diffraction and scanning electron microscopy techniques. Temperature evolution of optical transmission spectra as well as temperature dependences of optical pseudogap and Urbach energy is investigated. The influence of temperature-related and structural disordering on the Urbach tail is studied.

Original languageEnglish
Pages (from-to)1729-1733
Number of pages5
JournalThin Solid Films
Volume520
Issue number6
DOIs
Publication statusPublished - Jan 1 2012

Keywords

  • Absorption edge
  • Amorphous materials
  • Optical spectroscopy
  • Sputtering
  • Superionic conductors

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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    Studenyak, I. P., Kranjčec, M., Izai, V. Y., Chomolyak, A. A., Vorohta, M., Matolin, V., Cserhati, C., & Kökényesi, S. (2012). Structural and temperature-related disordering studies of Cu 6PS 5I amorphous thin films. Thin Solid Films, 520(6), 1729-1733. https://doi.org/10.1016/j.tsf.2011.08.043