Strain broadening caused by dislocations

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23 Citations (Scopus)

Abstract

Dislocations are extremely anisotropic lattice defects, thus their broadening effect is hkl dependent and therefore anisotropic On the other hand, a large number of work has shown that strain broadening caused by dislocations can be well described by a special logarithmic series expansion of the Fourier coefficients. In the present work it will be shown that this formalism can be incorporated into the classical methods of Williamson-Hall and Warren-Averbach. The new procedures are suggested to be called modified Williamson-Hall and modified Warren-Averbach methods, respectively. Examples of submicron grain size copper and electrodeposited nanocrystalline nickel specimen have proved that the modified methods can yield microstructural information in terms of particle size, dislocation densities and twinning, in good agreement with other microscopic methods, especially transmission electron microscopy The procedure is suggested as a possible microscopic model for strain anisotropy.

Original languageEnglish
Pages (from-to)151-156
Number of pages6
JournalMaterials Science Forum
Volume278-281
Issue numberPART 1
Publication statusPublished - Jan 1 1998

Keywords

  • Dislocations
  • Profile Analysis
  • Strain Broadening

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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