STM images of atomic-scale carbon nanotube defects produced by Ar + irradiation

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Multi-wall carbon nanotubes (MWCNTs) dispersed on graphite (HOPG) substrate were irradiated with Ar+ ions of 30 keV, using a low-dose of D = 5×1011 ions/cm2. The irradiated samples were investigated by scanning tunneling microscopy (STM) under ambient conditions. Atomic resolution STM images reveal individual nanotube defects, which appear as hillocks of 1-2 angstroms in height, due to the locally changed electronic structure. After annealing at 450 °C in nitrogen atmosphere, the irradiated MWCNTs were investigated again by STM. The effect of the heat treatment on the irradiation-induced nanotube defects is also discussed.

Original languageEnglish
Title of host publicationELECTRONIC PROPERTIES OF NOVEL NANOSTRUCTURES
Subtitle of host publicationXIX International Winterschool/Euroconference on Electronic Properties of Novel Materials
Pages154-157
Number of pages4
DOIs
Publication statusPublished - Sep 27 2005
EventELECTRONIC PROPERTIES OF NOVEL NANOSTRUCTURES: XIX International Winterschool/Euroconference on Electronic Properties of Novel Materials - Kirchberg, Tirol, Austria
Duration: Mar 12 2005Mar 19 2005

Publication series

NameAIP Conference Proceedings
Volume786
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

OtherELECTRONIC PROPERTIES OF NOVEL NANOSTRUCTURES: XIX International Winterschool/Euroconference on Electronic Properties of Novel Materials
CountryAustria
CityKirchberg, Tirol
Period3/12/053/19/05

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Keywords

  • Carbon Nanotube
  • Electronic Structure
  • Ion Irradiation
  • STM

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Osváth, Z., Vértesy, G., Tapasztó, L., Wéber, F., Horváth, Z. E., Gyulai, J., & Biró, L. P. (2005). STM images of atomic-scale carbon nanotube defects produced by Ar + irradiation. In ELECTRONIC PROPERTIES OF NOVEL NANOSTRUCTURES: XIX International Winterschool/Euroconference on Electronic Properties of Novel Materials (pp. 154-157). (AIP Conference Proceedings; Vol. 786). https://doi.org/10.1063/1.2103841