Abstract
A localized step melting of lead foils under the influence of UV (λ = 308nm) laser pulses is investigated. Standard nanosecond pump-and-probe measurements are performed to follow the surface evolution of lead samples. The surface morphology of the irradiated parts of the samples is examined by conventional optical microscopy-densitometry and atomic force microscopy methods. The surface corrugation is characterized by profilometry (Dektak).
| Original language | English |
|---|---|
| Pages (from-to) | 467-472 |
| Number of pages | 6 |
| Journal | Applied Surface Science |
| Volume | 236 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - Sep 15 2004 |
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Keywords
- Amorphous
- Crystalline
- UV laser
ASJC Scopus subject areas
- Physical and Theoretical Chemistry
- Surfaces, Coatings and Films
- Condensed Matter Physics
Cite this
Step melting of crystalline and amorphous lead foils due to irradiation by UV laser pulses. / Füle, M.; Horn, H.; Nánai, L.; George, Thomas F.
In: Applied Surface Science, Vol. 236, No. 1, 15.09.2004, p. 467-472.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Step melting of crystalline and amorphous lead foils due to irradiation by UV laser pulses
AU - Füle, M.
AU - Horn, H.
AU - Nánai, L.
AU - George, Thomas F.
PY - 2004/9/15
Y1 - 2004/9/15
N2 - A localized step melting of lead foils under the influence of UV (λ = 308nm) laser pulses is investigated. Standard nanosecond pump-and-probe measurements are performed to follow the surface evolution of lead samples. The surface morphology of the irradiated parts of the samples is examined by conventional optical microscopy-densitometry and atomic force microscopy methods. The surface corrugation is characterized by profilometry (Dektak).
AB - A localized step melting of lead foils under the influence of UV (λ = 308nm) laser pulses is investigated. Standard nanosecond pump-and-probe measurements are performed to follow the surface evolution of lead samples. The surface morphology of the irradiated parts of the samples is examined by conventional optical microscopy-densitometry and atomic force microscopy methods. The surface corrugation is characterized by profilometry (Dektak).
KW - Amorphous
KW - Crystalline
KW - UV laser
UR - http://www.scopus.com/inward/record.url?scp=4043059912&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=4043059912&partnerID=8YFLogxK
U2 - 10.1016/j.apsusc.2004.05.156
DO - 10.1016/j.apsusc.2004.05.156
M3 - Article
AN - SCOPUS:4043059912
VL - 236
SP - 467
EP - 472
JO - Applied Surface Science
JF - Applied Surface Science
SN - 0169-4332
IS - 1
ER -