SRS station 16.3: description and utilization of a high-resolution diffraction facility

S. P. Collins, B. M. Murphy, C. C. Tang, M. C. Miller, G. Oszlanyi

Research output: Contribution to journalConference article

10 Citations (Scopus)

Abstract

In this paper we give a brief description of SRS Station 16.3, and outline a novel approach to instrument control software. Operation of the Station is illustrated with three examples: resonant magnetic x-ray diffraction, high-resolution measurements of Kossel lines, and observations of resonant peak shifts in dynamical diffraction.

Original languageEnglish
Pages (from-to)A81-A83
JournalJournal of Physics D: Applied Physics
Volume32
Issue number10 A
DOIs
Publication statusPublished - May 21 1999
EventProceedings of the 1998 4th Biennial Conference on High Resolution X-Ray Diffraction and Topography (XTOP) - Durham, UK
Duration: Sep 9 1998Sep 11 1998

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Acoustics and Ultrasonics
  • Surfaces, Coatings and Films

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