Spectroscopic ellipsometry studies on the optical constants of Bi 4Ti3O12: xNa thin films grown by metal-organic chemical vapor deposition

S. Bin Anooz, J. Schwarzkopf, R. Dirsyte, E. Agócs, P. Petrik, A. Kwasniewski, G. Wagner, R. Fornari

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

We have deposited undoped and Na-doped epitaxial Bi4Ti 3O12 thin films on SrTiO3(001) substrates using the liquid-delivery spin metal-organic chemical vapor deposition technique. High resolution x-ray diffraction and Raman spectroscopy measurements were employed to investigate the structural perfection and incorporation of Na ions into the film. The ellipsometric measurements were carried out in the energy range 1.49-2.75 eV and the corresponding experimental data were fitted. Two different dispersion relations, Cauchy's absorbent and Tauc-Lorentz, have been used to determine the optical constants of the films. It is observed that there is a decrease in optical band gap for increasing sodium content. Furthermore, it has been found that the refractive index and extinction coefficient also depend on the sodium content. The refractive index dispersion data obeyed the single oscillator of the Wemple-DiDomenico model, from which the dispersion parameters were determined. The optical constants tend to decrease with increasing doping content.

Original languageEnglish
Pages (from-to)3782-3788
Number of pages7
JournalThin Solid Films
Volume519
Issue number11
DOIs
Publication statusPublished - Mar 31 2011

Fingerprint

Organic Chemicals
Optical constants
Spectroscopic ellipsometry
Organic chemicals
ellipsometry
metalorganic chemical vapor deposition
Chemical vapor deposition
Metals
Thin films
Refractive index
thin films
Sodium
sodium
refractivity
Optical band gaps
absorbents
Raman spectroscopy
delivery
extinction
x ray diffraction

Keywords

  • Bismuth titanate
  • Doping
  • Metal-organic chemical vapor deposition
  • Optical constants
  • Spectroscopic ellipsometry
  • Surface morphology
  • Thin films
  • X-ray diffraction

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Metals and Alloys
  • Surfaces, Coatings and Films
  • Surfaces and Interfaces

Cite this

Spectroscopic ellipsometry studies on the optical constants of Bi 4Ti3O12 : xNa thin films grown by metal-organic chemical vapor deposition. / Bin Anooz, S.; Schwarzkopf, J.; Dirsyte, R.; Agócs, E.; Petrik, P.; Kwasniewski, A.; Wagner, G.; Fornari, R.

In: Thin Solid Films, Vol. 519, No. 11, 31.03.2011, p. 3782-3788.

Research output: Contribution to journalArticle

Bin Anooz, S. ; Schwarzkopf, J. ; Dirsyte, R. ; Agócs, E. ; Petrik, P. ; Kwasniewski, A. ; Wagner, G. ; Fornari, R. / Spectroscopic ellipsometry studies on the optical constants of Bi 4Ti3O12 : xNa thin films grown by metal-organic chemical vapor deposition. In: Thin Solid Films. 2011 ; Vol. 519, No. 11. pp. 3782-3788.
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AU - Wagner, G.

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