Spectroscopic ellipsometric determination of the optical constants of chalcogenide films of the Ge-Sb-S-Te system

V. Pamukchieva, A. Szekeres, E. Svab, M. Fabian, Z. Revay, L. Szentmiklósi

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Spectroscopic ellipsometric studies of GexSb 40-xS50Te10 (x10, 20, 27) and Ge 27Sb13S55Te5 films evaporated on glass substrates demonstrated the compositional dependence of the optical constants, namely, as the Ge fraction in the films is increased from 10 to 27, the values of the refractive index and extinction coefficient gradually decrease, while the optical band gap increases from 1.04 eV to 1.33 eV.

Original languageEnglish
Article number012054
JournalJournal of Physics: Conference Series
Volume113
Issue number1
DOIs
Publication statusPublished - May 1 2008

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extinction
refractivity
glass
coefficients

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Spectroscopic ellipsometric determination of the optical constants of chalcogenide films of the Ge-Sb-S-Te system. / Pamukchieva, V.; Szekeres, A.; Svab, E.; Fabian, M.; Revay, Z.; Szentmiklósi, L.

In: Journal of Physics: Conference Series, Vol. 113, No. 1, 012054, 01.05.2008.

Research output: Contribution to journalArticle

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