Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration

T. Lohner, E. Agócs, P. Petrik, Z. Zolnai, E. Szilágyi, I. Kovács, Z. Szokefalvi-Nagy, L. Tóth, A. Tóth, L. Illés, I. Bársony

Research output: Contribution to journalArticle

Abstract

In this work recently produced and commercially available glazed ceramic object with metallic lustre decoration was studied by using a spectroscopic ellipsometer with rotating compensator. The thickness and metal content of the surface lustre layers are determined by ion beam analytical techniques, i.e., Rutherford backscattering spectrometry and external beam particle-induced X-ray emission and the results were utilized in the construction of multilayer optical models for the evaluation and interpretation of the spectroellipsometric measurements.

Original languageEnglish
Pages (from-to)715-719
Number of pages5
JournalThin Solid Films
Volume571
Issue numberP3
DOIs
Publication statusPublished - Nov 28 2014

Fingerprint

Optical multilayers
luster
Particle beams
Rutherford backscattering spectroscopy
Spectrometry
Ion beams
Metals
ion beams
ceramics
X rays
ellipsometers
compensators
particle beams
backscattering
evaluation
metals
spectroscopy
x rays

Keywords

  • Ag
  • Ellipsometry
  • Glaze
  • Ion beam analysis
  • Metallic lustre
  • PIXE
  • RBS

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Metals and Alloys
  • Surfaces, Coatings and Films
  • Surfaces and Interfaces

Cite this

Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration. / Lohner, T.; Agócs, E.; Petrik, P.; Zolnai, Z.; Szilágyi, E.; Kovács, I.; Szokefalvi-Nagy, Z.; Tóth, L.; Tóth, A.; Illés, L.; Bársony, I.

In: Thin Solid Films, Vol. 571, No. P3, 28.11.2014, p. 715-719.

Research output: Contribution to journalArticle

@article{8cbf254a71824ea894e0ea24681a0b06,
title = "Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration",
abstract = "In this work recently produced and commercially available glazed ceramic object with metallic lustre decoration was studied by using a spectroscopic ellipsometer with rotating compensator. The thickness and metal content of the surface lustre layers are determined by ion beam analytical techniques, i.e., Rutherford backscattering spectrometry and external beam particle-induced X-ray emission and the results were utilized in the construction of multilayer optical models for the evaluation and interpretation of the spectroellipsometric measurements.",
keywords = "Ag, Ellipsometry, Glaze, Ion beam analysis, Metallic lustre, PIXE, RBS",
author = "T. Lohner and E. Ag{\'o}cs and P. Petrik and Z. Zolnai and E. Szil{\'a}gyi and I. Kov{\'a}cs and Z. Szokefalvi-Nagy and L. T{\'o}th and A. T{\'o}th and L. Ill{\'e}s and I. B{\'a}rsony",
year = "2014",
month = "11",
day = "28",
doi = "10.1016/j.tsf.2013.11.055",
language = "English",
volume = "571",
pages = "715--719",
journal = "Thin Solid Films",
issn = "0040-6090",
publisher = "Elsevier",
number = "P3",

}

TY - JOUR

T1 - Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration

AU - Lohner, T.

AU - Agócs, E.

AU - Petrik, P.

AU - Zolnai, Z.

AU - Szilágyi, E.

AU - Kovács, I.

AU - Szokefalvi-Nagy, Z.

AU - Tóth, L.

AU - Tóth, A.

AU - Illés, L.

AU - Bársony, I.

PY - 2014/11/28

Y1 - 2014/11/28

N2 - In this work recently produced and commercially available glazed ceramic object with metallic lustre decoration was studied by using a spectroscopic ellipsometer with rotating compensator. The thickness and metal content of the surface lustre layers are determined by ion beam analytical techniques, i.e., Rutherford backscattering spectrometry and external beam particle-induced X-ray emission and the results were utilized in the construction of multilayer optical models for the evaluation and interpretation of the spectroellipsometric measurements.

AB - In this work recently produced and commercially available glazed ceramic object with metallic lustre decoration was studied by using a spectroscopic ellipsometer with rotating compensator. The thickness and metal content of the surface lustre layers are determined by ion beam analytical techniques, i.e., Rutherford backscattering spectrometry and external beam particle-induced X-ray emission and the results were utilized in the construction of multilayer optical models for the evaluation and interpretation of the spectroellipsometric measurements.

KW - Ag

KW - Ellipsometry

KW - Glaze

KW - Ion beam analysis

KW - Metallic lustre

KW - PIXE

KW - RBS

UR - http://www.scopus.com/inward/record.url?scp=84920705570&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84920705570&partnerID=8YFLogxK

U2 - 10.1016/j.tsf.2013.11.055

DO - 10.1016/j.tsf.2013.11.055

M3 - Article

VL - 571

SP - 715

EP - 719

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

IS - P3

ER -