Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration

T. Lohner, E. Agócs, P. Petrik, Z. Zolnai, E. Szilágyi, I. Kovács, Z. Szokefalvi-Nagy, L. Tóth, A. L. Tóth, L. Illés, I. Bársony

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Abstract

In this work recently produced and commercially available glazed ceramic object with metallic lustre decoration was studied by using a spectroscopic ellipsometer with rotating compensator. The thickness and metal content of the surface lustre layers are determined by ion beam analytical techniques, i.e., Rutherford backscattering spectrometry and external beam particle-induced X-ray emission and the results were utilized in the construction of multilayer optical models for the evaluation and interpretation of the spectroellipsometric measurements.

Original languageEnglish
Pages (from-to)715-719
Number of pages5
JournalThin Solid Films
Volume571
Issue numberP3
DOIs
Publication statusPublished - Nov 28 2014

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Keywords

  • Ag
  • Ellipsometry
  • Glaze
  • Ion beam analysis
  • Metallic lustre
  • PIXE
  • RBS

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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