Special issue on "current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III", E-MRS Spring 2012 - Symposium W, held in Strasbourg, France, May 14-18, 2012

Mircea Modreanu, Olivier Durand, Gerald E. Jellison, Giancarlo Salviati, Miklos Fried

Research output: Contribution to journalEditorial

Original languageEnglish
Pages (from-to)1-2
Number of pages2
JournalThin Solid Films
Volume541
DOIs
Publication statusPublished - Aug 31 2013

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this