Solid state effects in L-O X-ray transitions induced by O, Si and S ions in heavy metals

D. Banaś, J. Braziewicz, A. Kubala-Kukuś, U. Majewska, M. Pajek, J. Semaniak, T. Czyz;ewski, M. Jaskóla, W. Kretschmer, T. Mukoyama

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Abstract

Solid state effects for selected L-O(5p, 5d) X-ray transitions excited by O, Si and S ions of energies 0.4-2.0 MeV/amu are studied in metallic Os, Au, Bi, Th and U targets by measuring the L-X-rays with a semiconductor Si(Li) detector. Using the developed method of analysis of X-ray energy shifts and line broadening, combined with a change of the intensity-ratios, the ionization probabilities in M-, N- and O-shells during Lγ X-ray emission were estimated. We found that the ionization probabilities measured in this way for M-, N- and O-shells are generally in good agreement with the theoretical predictions of the `geometrical model', with the exception of L-O(5d) transition for the lighter (Os, Au and Bi) of the studied metals. We attribute this effect to the fast refilling of the 5d vacancies created in the collision by the delocalized valence band electrons. Such an effect is expected to be observed only when many electrons are removed from outer shells as a result of the multiple ionization.

Original languageEnglish
Pages (from-to)344-348
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume164
DOIs
Publication statusPublished - Apr 2000

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heavy metals
Heavy Metals
Heavy metals
Ions
Ionization
solid state
X rays
ionization
ions
x rays
refilling
Electrons
Valence bands
Vacancies
electrons
Metals
Semiconductor materials
Detectors
valence
collisions

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces

Cite this

Solid state effects in L-O X-ray transitions induced by O, Si and S ions in heavy metals. / Banaś, D.; Braziewicz, J.; Kubala-Kukuś, A.; Majewska, U.; Pajek, M.; Semaniak, J.; Czyz;ewski, T.; Jaskóla, M.; Kretschmer, W.; Mukoyama, T.

In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 164, 04.2000, p. 344-348.

Research output: Contribution to journalArticle

Banaś, D. ; Braziewicz, J. ; Kubala-Kukuś, A. ; Majewska, U. ; Pajek, M. ; Semaniak, J. ; Czyz;ewski, T. ; Jaskóla, M. ; Kretschmer, W. ; Mukoyama, T. / Solid state effects in L-O X-ray transitions induced by O, Si and S ions in heavy metals. In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 2000 ; Vol. 164. pp. 344-348.
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AU - Pajek, M.

AU - Semaniak, J.

AU - Czyz;ewski, T.

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AU - Kretschmer, W.

AU - Mukoyama, T.

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AB - Solid state effects for selected L-O(5p, 5d) X-ray transitions excited by O, Si and S ions of energies 0.4-2.0 MeV/amu are studied in metallic Os, Au, Bi, Th and U targets by measuring the L-X-rays with a semiconductor Si(Li) detector. Using the developed method of analysis of X-ray energy shifts and line broadening, combined with a change of the intensity-ratios, the ionization probabilities in M-, N- and O-shells during Lγ X-ray emission were estimated. We found that the ionization probabilities measured in this way for M-, N- and O-shells are generally in good agreement with the theoretical predictions of the `geometrical model', with the exception of L-O(5d) transition for the lighter (Os, Au and Bi) of the studied metals. We attribute this effect to the fast refilling of the 5d vacancies created in the collision by the delocalized valence band electrons. Such an effect is expected to be observed only when many electrons are removed from outer shells as a result of the multiple ionization.

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