Small angle neutron scattering and raman measurements of As-Se-S and As-Se-Te chalcogenide glassy semiconductors doped by samarium

R. I. Alekberov, S. I. Mekhtiyeva, A. I. Isayev, M. Fábián, Q. Tian, L. Almásy

Research output: Contribution to journalArticle

Abstract

In this work have been investigated the structural features of As-Se-S and As-Se-Te systems and their alloying with Sm on the nanometer scale using small-angle neutron scattering and Raman spectroscopy. These materials have two-phase porous structure, i.e. materials outfit with solid particles and includes free volumes. The parameters of fractal structure have been determined, in particular, the upper and lower boundaries of selfsimilarity and size of particles forming fractal clusters. The observed features of Raman scattering are associated with relaxation and excess density of states of acoustic vibrations in irregularities. Such irregularity areas are associated with the presence of nano-size inhomogeneities.

Original languageEnglish
Pages (from-to)79-85
Number of pages7
JournalChalcogenide Letters
Volume14
Issue number3
Publication statusPublished - Mar 1 2017

Keywords

  • Amorphous structure
  • Chalcogenide glass
  • Neutron scattering
  • Raman scattering

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Chemistry(all)
  • Physics and Astronomy(all)

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