Energy‐dispersive x‐ray fluorescence (EDXRF) analysis with a lateral resolution of 300 μm has been used in scanning electron microscopy to carry out model experiments for the identification of small glass fragments. Small sample dimensions can produce size effects which cause intensity changes in the EDXRF spectra as compared with bulk specimen spectra. These effects can be analysed by means of the inelastically scattered Mo Kα source line as long as the x‐ray spot size is smaller than the specimen dimension.
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics