Single event upset test at the cryring heavy-ion accelerator

D. Novák, A. Kerek, W. Klamra, L. O. Norlin, L. Bagge, A. Källberg, A. Paál, K. G. Rensfelt, J. Molnár

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

The energy and particle intensity domain of the CRYRING heavy-ion accelerator is well suited for studies of Single Event Upset phenomena. This effect occurs when a charged particle hits a working electronic circuit and the charge created alters its state. The radiative environment is one of the major problems for electronic circuits in an orbiting satellite. The situation is similar for future detectors at the new high-energy physics facilities, like the Large Hadron Collider (LHC) at CERN. The increasing use of submicron technology in combination with a lowering of the circuit voltage decreases the critical charge for temporary upsets. In this article the SEU test setup at CRYRING is described, where memories are used for testing digital circuit technologies. For these tests two types of particle extraction is used and two types of scintillator beam monitors (BaF2 and YAP) are described. Temporary, soft errors were recorded in static RAM memory circuits.

Original languageEnglish
Title of host publicationActa Physica Polonica B
Pages1603-1610
Number of pages8
Volume30
Edition5
Publication statusPublished - 1999

Fingerprint

single event upsets
ion accelerators
heavy ions
particle intensity
digital electronics
electronics
scintillation counters
monitors
charged particles
physics
energy
detectors
electric potential

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Novák, D., Kerek, A., Klamra, W., Norlin, L. O., Bagge, L., Källberg, A., ... Molnár, J. (1999). Single event upset test at the cryring heavy-ion accelerator. In Acta Physica Polonica B (5 ed., Vol. 30, pp. 1603-1610)

Single event upset test at the cryring heavy-ion accelerator. / Novák, D.; Kerek, A.; Klamra, W.; Norlin, L. O.; Bagge, L.; Källberg, A.; Paál, A.; Rensfelt, K. G.; Molnár, J.

Acta Physica Polonica B. Vol. 30 5. ed. 1999. p. 1603-1610.

Research output: Chapter in Book/Report/Conference proceedingChapter

Novák, D, Kerek, A, Klamra, W, Norlin, LO, Bagge, L, Källberg, A, Paál, A, Rensfelt, KG & Molnár, J 1999, Single event upset test at the cryring heavy-ion accelerator. in Acta Physica Polonica B. 5 edn, vol. 30, pp. 1603-1610.
Novák D, Kerek A, Klamra W, Norlin LO, Bagge L, Källberg A et al. Single event upset test at the cryring heavy-ion accelerator. In Acta Physica Polonica B. 5 ed. Vol. 30. 1999. p. 1603-1610
Novák, D. ; Kerek, A. ; Klamra, W. ; Norlin, L. O. ; Bagge, L. ; Källberg, A. ; Paál, A. ; Rensfelt, K. G. ; Molnár, J. / Single event upset test at the cryring heavy-ion accelerator. Acta Physica Polonica B. Vol. 30 5. ed. 1999. pp. 1603-1610
@inbook{e8a0f65dff844d44be90a6dfebc40661,
title = "Single event upset test at the cryring heavy-ion accelerator",
abstract = "The energy and particle intensity domain of the CRYRING heavy-ion accelerator is well suited for studies of Single Event Upset phenomena. This effect occurs when a charged particle hits a working electronic circuit and the charge created alters its state. The radiative environment is one of the major problems for electronic circuits in an orbiting satellite. The situation is similar for future detectors at the new high-energy physics facilities, like the Large Hadron Collider (LHC) at CERN. The increasing use of submicron technology in combination with a lowering of the circuit voltage decreases the critical charge for temporary upsets. In this article the SEU test setup at CRYRING is described, where memories are used for testing digital circuit technologies. For these tests two types of particle extraction is used and two types of scintillator beam monitors (BaF2 and YAP) are described. Temporary, soft errors were recorded in static RAM memory circuits.",
author = "D. Nov{\'a}k and A. Kerek and W. Klamra and Norlin, {L. O.} and L. Bagge and A. K{\"a}llberg and A. Pa{\'a}l and Rensfelt, {K. G.} and J. Moln{\'a}r",
year = "1999",
language = "English",
volume = "30",
pages = "1603--1610",
booktitle = "Acta Physica Polonica B",
edition = "5",

}

TY - CHAP

T1 - Single event upset test at the cryring heavy-ion accelerator

AU - Novák, D.

AU - Kerek, A.

AU - Klamra, W.

AU - Norlin, L. O.

AU - Bagge, L.

AU - Källberg, A.

AU - Paál, A.

AU - Rensfelt, K. G.

AU - Molnár, J.

PY - 1999

Y1 - 1999

N2 - The energy and particle intensity domain of the CRYRING heavy-ion accelerator is well suited for studies of Single Event Upset phenomena. This effect occurs when a charged particle hits a working electronic circuit and the charge created alters its state. The radiative environment is one of the major problems for electronic circuits in an orbiting satellite. The situation is similar for future detectors at the new high-energy physics facilities, like the Large Hadron Collider (LHC) at CERN. The increasing use of submicron technology in combination with a lowering of the circuit voltage decreases the critical charge for temporary upsets. In this article the SEU test setup at CRYRING is described, where memories are used for testing digital circuit technologies. For these tests two types of particle extraction is used and two types of scintillator beam monitors (BaF2 and YAP) are described. Temporary, soft errors were recorded in static RAM memory circuits.

AB - The energy and particle intensity domain of the CRYRING heavy-ion accelerator is well suited for studies of Single Event Upset phenomena. This effect occurs when a charged particle hits a working electronic circuit and the charge created alters its state. The radiative environment is one of the major problems for electronic circuits in an orbiting satellite. The situation is similar for future detectors at the new high-energy physics facilities, like the Large Hadron Collider (LHC) at CERN. The increasing use of submicron technology in combination with a lowering of the circuit voltage decreases the critical charge for temporary upsets. In this article the SEU test setup at CRYRING is described, where memories are used for testing digital circuit technologies. For these tests two types of particle extraction is used and two types of scintillator beam monitors (BaF2 and YAP) are described. Temporary, soft errors were recorded in static RAM memory circuits.

UR - http://www.scopus.com/inward/record.url?scp=33744532672&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33744532672&partnerID=8YFLogxK

M3 - Chapter

AN - SCOPUS:33744532672

VL - 30

SP - 1603

EP - 1610

BT - Acta Physica Polonica B

ER -