Single-beam thermal-wave microscopes based on fourier imaging of phase information

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3 Citations (Scopus)

Abstract

Thermal-wave microscopes usually employ different means for periodic heating and for detection. In this paper the reflected part of the focused heating beam is considered as a possible means for detection. In particular the dark-field and the phase contrast methods are studied.

Original languageEnglish
Pages (from-to)35-40
Number of pages6
JournalApplied Physics B Photophysics and Laser Chemistry
Volume47
Issue number1
DOIs
Publication statusPublished - Sep 1988

Fingerprint

Microscopes
microscopes
Imaging techniques
Heating
heating
phase contrast
Hot Temperature

Keywords

  • 65.00
  • 81.70+r

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Physics and Astronomy (miscellaneous)
  • Engineering(all)

Cite this

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title = "Single-beam thermal-wave microscopes based on fourier imaging of phase information",
abstract = "Thermal-wave microscopes usually employ different means for periodic heating and for detection. In this paper the reflected part of the focused heating beam is considered as a possible means for detection. In particular the dark-field and the phase contrast methods are studied.",
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author = "A. Lőrincz",
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