Simultaneous investigation of the crystal structure and electrical properties of crystallized germanium films by UHV in situ electron microscopy

Á Barna, P. B. Barna, Z. Bodó, J. F. Pócza, I. Pozsgai, G. Radnóczi

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

Three types of crystallization have been observed, depending on the gaseous contamination of the a-Ge films. A correlation between the crystallized structures and the corresponding electrical properties was found. In order to explain the measured Hall mobility of the crystalline Ge films, a model has been constructed in which the potential barrier of the grain boundaries is taken into account.

Original languageEnglish
Pages (from-to)49-62
Number of pages14
JournalThin Solid Films
Volume23
Issue number1
DOIs
Publication statusPublished - Aug 1974

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Simultaneous investigation of the crystal structure and electrical properties of crystallized germanium films by UHV in situ electron microscopy'. Together they form a unique fingerprint.

  • Cite this