SIMS characterization of noble metal-based thin film electrodes

C. Piccirillo, S. Daolio, S. Gelosi, C. Pagura, B. Facchin, J. Kristof

Research output: Contribution to journalArticle

Abstract

The influence of the support material on the formation of TiO2 from the isopropanolic solution of titanium diisopropoxide bis-2,4-pentanedionate on titanium and nickel supports was investigated by Secondary Ion Mass Spectrometry. It was found that the support material strongly influences the penetration characteristics of titania, and via this the structure of the coating-support interface. The penetration of TiO2 into the support is also influenced by the nature of the noble metal oxide in mixed oxide systems. Concentration depth profiles showed that titania can penetrate deeper into titanium metal in the presence of RuO2, while IrO2 showed a definite hindering effect.

Original languageEnglish
Pages (from-to)625-630
Number of pages6
JournalMaterials Science Forum
Volume235-238
Issue numberPART 2
Publication statusPublished - Dec 1 1997

Keywords

  • Depth Profiling
  • Electrocatalysis
  • Film Electrode
  • Iridium Dioxide
  • Ruthenium Dioxide
  • Secondary Ion Mass Spectrometry
  • Titanium Dioxide

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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  • Cite this

    Piccirillo, C., Daolio, S., Gelosi, S., Pagura, C., Facchin, B., & Kristof, J. (1997). SIMS characterization of noble metal-based thin film electrodes. Materials Science Forum, 235-238(PART 2), 625-630.