SIMS characterization of noble metal-based thin film electrodes

C. Piccirillo, S. Daolio, S. Gelosi, C. Pagura, B. Facchin, J. Kristóf

Research output: Contribution to journalArticle

Abstract

The influence of the support material on the formation of TiO2 from the isopropanolic solution of titanium diisopropoxide bis-2,4-pentanedionate on titanium and nickel supports was investigated by Secondary Ion Mass Spectrometry. It was found that the support material strongly influences the penetration characteristics of titania, and via this the structure of the coating-support interface. The penetration of TiO2 into the support is also influenced by the nature of the noble metal oxide in mixed oxide systems. Concentration depth profiles showed that titania can penetrate deeper into titanium metal in the presence of RuO2, while IrO2 showed a definite hindering effect.

Original languageEnglish
Pages (from-to)625-630
Number of pages6
JournalMaterials Science Forum
Volume235-238
Issue numberPART 2
Publication statusPublished - 1997

Fingerprint

Precious metals
Secondary ion mass spectrometry
Titanium
noble metals
secondary ion mass spectrometry
titanium
Thin films
Oxides
Electrodes
electrodes
thin films
Nickel
penetration
Metals
mixed oxides
Coatings
metal oxides
nickel
coatings
profiles

Keywords

  • Depth Profiling
  • Electrocatalysis
  • Film Electrode
  • Iridium Dioxide
  • Ruthenium Dioxide
  • Secondary Ion Mass Spectrometry
  • Titanium Dioxide

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Piccirillo, C., Daolio, S., Gelosi, S., Pagura, C., Facchin, B., & Kristóf, J. (1997). SIMS characterization of noble metal-based thin film electrodes. Materials Science Forum, 235-238(PART 2), 625-630.

SIMS characterization of noble metal-based thin film electrodes. / Piccirillo, C.; Daolio, S.; Gelosi, S.; Pagura, C.; Facchin, B.; Kristóf, J.

In: Materials Science Forum, Vol. 235-238, No. PART 2, 1997, p. 625-630.

Research output: Contribution to journalArticle

Piccirillo, C, Daolio, S, Gelosi, S, Pagura, C, Facchin, B & Kristóf, J 1997, 'SIMS characterization of noble metal-based thin film electrodes', Materials Science Forum, vol. 235-238, no. PART 2, pp. 625-630.
Piccirillo C, Daolio S, Gelosi S, Pagura C, Facchin B, Kristóf J. SIMS characterization of noble metal-based thin film electrodes. Materials Science Forum. 1997;235-238(PART 2):625-630.
Piccirillo, C. ; Daolio, S. ; Gelosi, S. ; Pagura, C. ; Facchin, B. ; Kristóf, J. / SIMS characterization of noble metal-based thin film electrodes. In: Materials Science Forum. 1997 ; Vol. 235-238, No. PART 2. pp. 625-630.
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