SIMS and Auger investigation of oxygen adsorption on polycrystalline nickel surface

Zoltán Tass, Katalin V. Josepovits

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Abstract

As it is known, the secondary ion yields increase stepwise upon increasing O2 exposure, during SIMS measurements on metal samples in an oxygen atmosphere. Taking Auger spectra at varying oxygen exposure, the variation of satellite peaks and the chemical shift has been monitored, and a similar step-like dependence at the same range of oxygen exposures was found. This shows, that the discontinuous increase in the secondary ion intensity is due to the different types of oxides formed on the metal surface. Identification of these oxides are discussed.

Original languageEnglish
Pages (from-to)481-484
Number of pages4
JournalMikrochimica Acta
Volume114-115
Issue number1
DOIs
Publication statusPublished - Dec 1 1994

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Keywords

  • Auger spectroscopy
  • SIMS
  • nickel surface
  • oxygen adsorption

ASJC Scopus subject areas

  • Analytical Chemistry

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