Signaling free localization of node failures in all-optical networks

János Tapolcai, Lajos Rónyai, Éva Hosszu, Pin Han Ho, Suresh Subramaniam

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

Network-wide local unambiguous failure localization (NL-UFL) [1] has been demonstrated as an interesting scenario of monitoring trails (m-trails). It attempts to enable every node to autonomously localize any failure event in the network in a distributed and all-optical manner by inspecting a set of m-trails traversing through the node. This paper investigates the m-trail allocation problem under the NL-UFL scenario by taking each link and node failure event into consideration. Bound analysis is performed using combinatorial group testing (CGT) theory and this is followed by the introduction of a novel heuristic on general topologies. Extensive simulation is conducted to examine the proposed heuristic in terms of the required cover length and the number of m-trails to achieve NL-UFL.

Original languageEnglish
Title of host publicationIEEE INFOCOM 2014 - IEEE Conference on Computer Communications
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1860-1868
Number of pages9
ISBN (Print)9781479933600
DOIs
Publication statusPublished - Jan 1 2014
Event33rd IEEE Conference on Computer Communications, IEEE INFOCOM 2014 - Toronto, ON, Canada
Duration: Apr 27 2014May 2 2014

Publication series

NameProceedings - IEEE INFOCOM
ISSN (Print)0743-166X

Other

Other33rd IEEE Conference on Computer Communications, IEEE INFOCOM 2014
CountryCanada
CityToronto, ON
Period4/27/145/2/14

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ASJC Scopus subject areas

  • Computer Science(all)
  • Electrical and Electronic Engineering

Cite this

Tapolcai, J., Rónyai, L., Hosszu, É., Ho, P. H., & Subramaniam, S. (2014). Signaling free localization of node failures in all-optical networks. In IEEE INFOCOM 2014 - IEEE Conference on Computer Communications (pp. 1860-1868). [6848125] (Proceedings - IEEE INFOCOM). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/INFOCOM.2014.6848125