Scattering extraction of ions at CRYRING for SEU testing

D. Novák, A. Kerek, W. Klamra, L. O. Norlin, L. Bagge, A. Källberg, A. Paál, K. G. Rensfelt, J. Molnár

Research output: Contribution to journalArticle

Abstract

A measuring station has been built at the CRYRING heavy ion accelerator to test the Single Event Upset (SEU) phenomena in working Static RAM circuits. The setup extracts the beam using Rutherford scattering and the ions are monitored with a BaF2 scintillator. SEU measurements have been performed for standard bulk CMOS memory circuits.

Original languageEnglish
Pages (from-to)166-170
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume430
Issue number1
DOIs
Publication statusPublished - Jun 1999

Fingerprint

single event upsets
Scattering
ion accelerators
Networks (circuits)
Ions
Testing
Random access storage
Heavy ions
scattering
Phosphors
scintillation counters
Particle accelerators
CMOS
heavy ions
ions
stations
Data storage equipment

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

Cite this

Scattering extraction of ions at CRYRING for SEU testing. / Novák, D.; Kerek, A.; Klamra, W.; Norlin, L. O.; Bagge, L.; Källberg, A.; Paál, A.; Rensfelt, K. G.; Molnár, J.

In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 430, No. 1, 06.1999, p. 166-170.

Research output: Contribution to journalArticle

Novák, D. ; Kerek, A. ; Klamra, W. ; Norlin, L. O. ; Bagge, L. ; Källberg, A. ; Paál, A. ; Rensfelt, K. G. ; Molnár, J. / Scattering extraction of ions at CRYRING for SEU testing. In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 1999 ; Vol. 430, No. 1. pp. 166-170.
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