Scanning X-ray diffraction peak profile analysis in deformed Cu-polycrystals by synchrotron radiation

M. Zehetbauer, T. Ungár, R. Kral, A. Borbély, E. Schafler, B. Ortner, H. Amenitsch, S. Bernstorff

Research output: Contribution to journalArticle

57 Citations (Scopus)

Abstract

Densities and arrangements of dislocations and mesoscopic long-range internal stresses in cold-rolled polycrystalline copper were determined in scanning mode by X-ray peak profile analysis with synchrotron radiation. The high brilliance enabled the use of a focal spot of less than 50 μm. The diffraction profiles of the 200 reflections were measured by scanning the specimen step by step in front of the beam. In this way, the heterogeneities of the deformation-induced microstructure within single grains were obtained. At small deformations including stage III, the dislocation densities and the internal stresses were uniform within the grain interior, but larger near the grain boundaries where the dislocations showed a tendency to form stress-intensive arrangements. At higher deformations towards and in stage IV, the dislocation density and the internal stresses increasingly fluctuated within the whole grain. The fluctuations were interpreted as the transformations of polarized dipolar dislocation walls (PDW) into polarized tilt walls (PTW) observed recently by macroscopic diffraction experiments on highly deformed specimens. These results are important for the current research of strengthening processes in stage FV.

Original languageEnglish
Pages (from-to)1053-1061
Number of pages9
JournalActa Materialia
Volume47
Issue number3
DOIs
Publication statusPublished - Jan 1 1999

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Polymers and Plastics
  • Metals and Alloys

Fingerprint Dive into the research topics of 'Scanning X-ray diffraction peak profile analysis in deformed Cu-polycrystals by synchrotron radiation'. Together they form a unique fingerprint.

  • Cite this

    Zehetbauer, M., Ungár, T., Kral, R., Borbély, A., Schafler, E., Ortner, B., Amenitsch, H., & Bernstorff, S. (1999). Scanning X-ray diffraction peak profile analysis in deformed Cu-polycrystals by synchrotron radiation. Acta Materialia, 47(3), 1053-1061. https://doi.org/10.1016/S1359-6454(98)00366-8